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Yasushi Oshikane
Observed names:
Oshikane Yasushi,
Y Oshikane,
Y. Oshikane,
Yasushi OSHIKANE
Institution:
The University of Osaka
Observed institution:
The University of Osaka
OpenAlex ID:
A5085770938
Efficient Soft X-Ray Lasing at 6 to 8 nm with Nickel-like Lanthanide Ions
1995
·
H. Daido
, Y. Kato
, et al.
·
Physical Review Letters
·
88
Observation of nanostructure by scanning near-field optical microscope with small sphere probe
2007
·
Yasushi Oshikane
, Toshihiko Kataoka
, et al.
·
Science and Technology of Advanced Materials
·
79
PDF
Atomically resolved scanning tunneling microscopy of hydrogen-terminated Si(001) surfaces after HF cleaning
2000
·
Kenta Arima
, Katsuyoshi Endo
, et al.
·
Applied Physics Letters
·
70
MEMS hydrogen gas sensor with wireless quartz crystal resonator
2021
·
Lianjie Zhou
, Fumihito Kato
, et al.
·
Sensors and Actuators B Chemical
·
68
PDF
Atomic structures of hydrogen-terminated Si(001) surfaces after wet cleaning by scanning tunneling microscopy
1998
·
Katsuyoshi Endo
, Kenta Arima
, et al.
·
Applied Physics Letters
·
40
STM-induced light emission from thin films of perylene derivatives on the HOPG and Au substrates
2011
·
Aya Fujiki
, Yusuke Miyake
, et al.
·
Nanoscale Research Letters
·
19
PDF
Spherical concave mirror measurement by phase-shifting point diffraction interferometer with two optical fibers
2009
·
Toshiaki Matsuura
, Kazuaki Udaka
, et al.
·
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
·
15
Scanning tunneling microscopy study of hydrogen-terminated Si(001) surfaces after wet cleaning
2000
·
K. Arima
, K. Endo
, et al.
·
Surface Science
·
14
Development of a scanning near-field optical microscope with a probe consisting of a small spherical protrusion
1996
·
T. Kataoka
, K. Endo
, et al.
·
Ultramicroscopy
·
14
Nanometer-level self-aggregation and three-dimensional growth of copper nanoparticles under dielectric barrier discharge at atmospheric pressure
2012
·
Yuto Yamamoto
, Hiroki Akiyama
, et al.
·
Current Applied Physics
·
10
Measurement Accuracy in Phase-Shifting Point Diffraction Interferometer with Two Optical Fibers
2007
·
Toshiaki Matsuura
, Satoru Okagaki
, et al.
·
Optical Review
·
9
An atomically controlled Si film formation process at low temperatures using atmospheric-pressure VHF plasma
2011
·
K Yasutake
, H Kakiuchi
, et al.
·
Journal of Physics Condensed Matter
·
8
Design and fabrication of active spectral filter with metal-insulator-metal structure for visible light communication
2013
·
Kensuke Murai
, Yasushi Oshikane
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
6
Numerical reconstruction of wavefront in phase‐shifting point diffraction interferometer by digital holography
2008
·
Toshiaki Matsuura
, Satoru Okagaki
, et al.
·
Surface and Interface Analysis
·
6
3D-FEM analysis of SPP excitation through nanoholes in asymmetric metal-insulator-metal structure at tip of circular truncated conical fiber
2014
·
Y. Oshikane
, K. Murai
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
5
Extracting and focusing of surface plasmon polaritons inside finite asymmetric metal/insulator/metal structure at apex of optical fiber by subwavelength holes
2013
·
Yasushi Oshikane
, Kensuke Murai
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
5
Phase-Shifting Point Diffraction Interferometer Having Two Point Light Sources of Single-Mode Optical Fibers
2012
·
Oshikane Yasushi
, Nakano Motohiro
, et al.
·
InTech eBooks
·
3
PDF
Observation of localized optical near‐field generated by submicron two‐hole structure for novel SNOM probe
2008
·
Yasushi Oshikane
, Seiji Hara
, et al.
·
Surface and Interface Analysis
·
3
Measurement of Ultra Fine Defects on the Si Wafer Surface Using a Laser Light Scattering Method.
2002
·
Haruyuki INOUE
, Toshihiko KATAOKA
, et al.
·
Journal of the Japan Society for Precision Engineering
·
3
PDF
Light Scattering by Small particles and Small Defects on the Silicon Wafer Surface. Calculations of Scattering Light Intensity and Optical Image through a Lens.
2000
·
Toshihiko KATAOKA
, Haruyuki INOUE
, et al.
·
Journal of the Japan Society for Precision Engineering
·
3
PDF
Plasmonic active spectral filter in VIS-NIR region using metal-insulator-metal (MIM) structure on glass plate
2012
·
Yasushi Oshikane
, Kensuke Murai
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
(Invited) Electroluminescence in Metal-Oxide-Semiconductor Tunnel Diodes with Nanometer-Thick Silicon
2012
·
Mizuho Morita
, Ayano Tsuchida
, et al.
·
ECS Transactions
·
2
STM/STS and the first principles calculations on Al/Si(001)2×1
1998
·
K. Endo
, K. Arima
, et al.
·
Applied Physics A
·
2
Measurement of Ultra Fine Particles on the Si Wafer Surface Using a Laser Light Scattering Method.
1997
·
Haruyuki INOUE
, Toshihiko KATAOKA
, et al.
·
Journal of the Japan Society for Precision Engineering
·
2
PDF
Measurement of absorption distribution by second harmonic and x-ray images
1996
·
K. A. Tanaka
, T. Ohnishi
, et al.
·
AIP conference proceedings
·
2
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Works count:
70
Citation count:
485
H-index:
10
I10-index:
10
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