Author

Andrew Walls

Observed names: A. D. Walls, Walls, Andrew

Observed institution: IBM (United States)

OpenAlex ID: A5085917261

Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems

2014 · Nikolaos Papandreou, Thomas Parnell, et al. · 41

Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash

2020 · Nikolaos Papandreou, Haralampos Pozidis, et al. · IEEE International Reliability Physics Symposium proceedings · 22

Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization

2015 · Nikolaos Papandreou, Thomas Parnell, et al. · ACM Transactions on Design Automation of Electronic Systems · 15

Improving NAND flash performance with read heat separation

2020 · Roman Pletka, Nikolaos Papandreou, et al. · Proceedings - International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunication Systems · 9

Flash storage integration in the IBM System z EC12 I/O drawer

2013 · E. W. Chencinski, M. J. Anderson, et al. · IBM Journal of Research and Development · 6

Works count: 6

Citation count: 93

H-index: 5

I10-index: 3