Author

Rupali Verma

Observed name: Verma, Rupali
ORCID: 0000-0001-5629-9070
Observed ORCIDs: 0000-0001-5629-9070, 0009-0002-7337-3943
OpenAlex ID: A5086263561
2021 · Pansy Nandwani, Rupali Verma · Social Network Analysis and Mining · 956
2016 · Nivedan Bhardwaj, Ritesh Kumar, et al. · International Conference on Recent Trends in Information Technology · 23
2016 · Rupali Verma, Maitreyee Dutta, et al. · International Conference on Computational Techniques in Information and Communication Technologies · 8
2025 · Utpreksh Patbhaje, Rupali Verma, et al. · npj 2D Materials and Applications · 6
2024 · Utpreksh Patbhaje, Rupali Verma, et al. · IEEE International Reliability Physics Symposium proceedings · 5
2023 · Utpreksh Patbhaje, Rupali Verma, et al. · IEEE International Reliability Physics Symposium proceedings · 5
2025 · Rupali Verma, Utpreksh Patbhaje, et al. · npj 2D Materials and Applications · 4
2024 · Jeevesh Kumar, Aadil Bashir Dar, et al. · IEEE International Reliability Physics Symposium proceedings · 3
2020 · Bhavna, Rupali Verma, et al. · Lecture notes in electrical engineering · 3
2018 · Rupali Verma, Maitreyee Dutta, et al. · Lecture notes in computer science · 3
2025 · Utpreksh Patbhaje, Rupali Verma, et al. · npj 2D Materials and Applications · 2
2024 · Asif A. Shah, Rupali Verma, et al. · IEEE International Reliability Physics Symposium proceedings · 2
2024 · Biswajeet Nayak, Rupali Verma, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 2
2022 · Nancy Rani, Rupali Verma, et al. · Wiley eBooks · 2
2015 · Rupali Verma, Maitreyee Dutta, et al. · International Conference on Signal Processing and Integrated Networks (SPIN) · 2
2025 · Anam Arora, Neha Jain, et al. · Molecular Pharmaceutics · 1
2025 · Utpreksh Patbhaje, Rupali Verma, et al. · IEEE International Reliability Physics Symposium proceedings · 1
2024 · Rupali Verma, Utpreksh Patbhaje, et al. · IEEE International Reliability Physics Symposium proceedings · 1
2024 · Purbasha Ray, Rupali Verma, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 1
2023 · Rupali Verma, Utpreksh Patbhaje, et al. · IEEE International Reliability Physics Symposium proceedings · 1
Works count: 37
Citation count: 1,041
H-index: 5
I10-index: 2
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