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Frank Schlaphof

Observed names: Dr Frank Schlaphof, F Schlaphof, F. SCHLAPHOF, F. Schlaphof, Schlaphof, F., Schlaphof, Frank
ORCID: 0009-0008-9007-4164
Observed ORCID: 0009-0008-9007-4164
OpenAlex ID: A5087116355
Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy
2000 · A. Roelofs, U. Böttger, et al. · Applied Physics Letters · 167
Depolarizing-field-mediated 180° switching in ferroelectric thin films with 90° domains
2002 · A. Roelofs, N. A. Pertsev, et al. · Applied Physics Letters · 106
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Scanning force microscopy investigation of the Pb(Zr0.25Ti0.75)O3/Pt interface
2002 · X. M. Lu, F. Schlaphof, et al. · Applied Physics Letters · 48
Identification of ferroelectric domain structures in BaTiO3 for Raman spectroscopy
2003 · Patricio Lagos L, Rodolfo Hermans Z, et al. · Surface Science · 36
Nanometer spot allocation for Raman spectroscopy on ferroelectrics by polarization and piezoresponse force microscopy
2001 · G. Tarrach, P. Lagos L., et al. · Applied Physics Letters · 28
Three-Dimensional Electric Field Probing of Ferroelectrics on the Nanometer Scale Using Scanning Force Microscopy
2007 · L. M. Eng, S. Grafström, et al. · Springer eBooks · 25
Surface effect on the electrical and optical properties of barium titanate at room temperature
2005 · H. Chaib, L. M. Eng, et al. · Physical Review B · 24
Near-field spectroscopy with white-light illumination
2001 · J. Seidel, S. Grafström, et al. · Applied Physics Letters · 18
Lamellar ferroelectric domains in PbTiO3 grains imaged and manipulated by AFM
2003 · Ch. Loppacher, F. Schlaphof, et al. · Surface Science · 16
Evolution and Optimization of BEOL MOM Capacitors Across Advanced CMOS Nodes
2018 · Jinglin Shi, A. Sidelnicov, et al. · European Solid-State Device Research Conference · 15
Observation and manipulation of the as-grown maze domain structure in lead germanate by scanning force microscopy
2006 · E. I. Shishkin, V. Ya. Shur, et al. · Applied Physics Letters · 15
Electric and optical properties of the 90° ferroelectric domain wall in tetragonal barium titanate
2003 · H Chaib, F Schlaphof, et al. · Journal of Physics Condensed Matter · 12
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Status and future aspects in nanoscale surface inspection of ferroics by scanning probe microscopy
2001 · L. M. Eng, F. Schlaphof, et al. · Ferroelectrics · 12
Influence of proton elastic scattering on soft error generation of SRAMs
2011 · M. Kosmata, J. Auerhammer, et al. · European Conference on Radiation and Its Effects on Components and Systems · 7
Electrical and Optical Properties in the 180° Ferroelectric Domain Wall of Tetragonal KNbO 3
2003 · H. Chaib, F. Schlaphof, et al. · Ferroelectrics · 6
Local Dielectric and Polarization Properties of Inner and Outer Interfaces in PZT Thin Films
2004 · L. M. ENG, S. GRAFSTRÖM, et al. · Integrated ferroelectrics · 4
Nanoscale nondestructive electric field probing in ferroelectrics, organic molecular films and near-field optical nanodevices
2004 · Lukas M. Eng, Stefan Grafstrom, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Magnetic Immunity in STT-MRAM a Rational Approach to a Manageable Challenge
2026 · Johannes Mueller, Frank Schlaphof, et al. · IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers)
Impact of Interdependent TDDB Acceleration Parameters on Extended Mission Profile Evaluation: A Case Study for Low-K Dielectrics - SiCOH
2026 · S. Muniswamy, F. Schlaphof, et al. · IEEE International Reliability Physics Symposium proceedings
Impact of Interdependent TDDB Acceleration Parameters on Extended Mission Profile Evaluation: A Case Study for Low-k Dielectrics - SiCOH
2026 · IEEE International Symposium on Reliability Physics 2026, Herklotz, Markus, et al. · Underline Science Inc.
Standby magnetic immunity calculator for STT-MRAM
2026 · A. Talapatra, F. Schlaphof, et al. · AIP Advances
BEoL Reliability, XPS and REELS Study on low-k Dielectrics to understand Breakdown Mechanisms
2020 · B. Wehring, R. Hoffmann, et al. · IEEE International Reliability Physics Symposium proceedings
Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in PZT Thin Films
2004 · L. M. Eng, S. Grafström, et al. · Nanoscience and technology
Works count: 27
Citation count: 541
H-index: 12
I10-index: 13
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