Guanqun Qiu
Author
Alternate name Guanqun Qiu
Institution Khalifa University of Science and Technology
Past institutions Khalifa University of Science and Technology, Chongqing University
ORCID: Yes
H-index: 7
I10-index: 6
Works count: 21
Citations count: 207
Bias Temperature Instability of Silicon Carbide Power MOSFET under AC Gate Stresses
2021 · Xiaohan Zhong, Huaping Jiang, et al. · IEEE Transactions on Power Electronics
Dynamic Gate Stress Induced Threshold Voltage Drift of Silicon Carbide MOSFET
2020 · Huaping Jiang, Xiaohan Zhong, et al. · IEEE Electron Device Letters
A Physical Explanation of Threshold Voltage Drift of SiC MOSFET Induced by Gate Switching
2022 · Huaping Jiang, Xiaowei Qi, et al. · IEEE Transactions on Power Electronics