Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Jaber Al Rashid
Observed names:
Jaber AL Rashid,
Md Jaber Al Rashid,
Md. Jaber Al Rashid
Institutions:
École Supérieure d'Électronique de l'Ouest,
Université d'Angers
Observed institutions:
Institut d'Électronique et des Technologies du numéRique,
Laboratoire Angevin de Recherche en Mathématiques,
École Supérieure d'Électronique de l'Ouest,
Université d'Angers,
BRAC University
ORCID:
0000-0003-2007-5491
Observed ORCID:
0000-0003-2007-5491
OpenAlex ID:
A5087698820
An autonomous industrial robot for loading and unloading goods
2015
·
Md. Abdul Kadir
, Md. Belayet Chowdhury
, et al.
·
International Conference on Informatics, Electronics & Vision (ICIEV)
·
11
Coupling simulation and accelerated degradation model for reliability estimation: Application to a voltage regulator
2022
·
Jaber Al Rashid
, Laurent Saintis
, et al.
·
Microelectronics Reliability
·
10
PDF
A Novel Approach of Improving Battery Performance and Longevity of the Developed Electrically Assisted Triwheeler Vehicle by Implementing Torque Sensor Technology
2017
·
Md. Jaber Al Rashid
, Ataur Rahman
, et al.
·
International Journal of Vehicular Technology
·
8
PDF
A State-of-the-Art Review on IC EMC Reliability
2021
·
Jaber Al Rashid
, Mohsen Koohestani
, et al.
·
European Safety and Reliability Conference (ESREL)
·
7
Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and a Case Study
2023
·
Jaber Al Rashid
, Mohsen Koohestani
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
5
PDF
Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems
2023
·
Jaber Al Rashid
, Mohsen Koohestani
, et al.
·
IEEE Letters on Electromagnetic Compatibility Practice and Applications
·
5
PDF
Lifetime reliability modeling on EMC performance of digital ICs influenced by the environmental and aging constraints: A case study
2024
·
Jaber Al Rashid
, Mohsen Koohestani
, et al.
·
Microelectronics Reliability
·
3
High Temperature Accelerated Ageing Influence on the Conducted Immunity Modelling of the Commonly Used Voltage Regulator ICs
2023
·
Jaber Al Rashid
, Mohsen Koohestani
, et al.
·
International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)
·
2
PDF
Electrification in Rural Bangladesh Using Solar Home System: Progress, Problems and Prospect
2017
·
Jaber Al Rashid
, Ataur Rahman
, et al.
·
International Journal of Energy Information and Communications
·
1
PDF
Degradation and Lifetime Reliability Models to Assess the Electromagnetic Compatibility Performance of Integrated Circuits Under Environmental Constraints
2023
·
Md Jaber Al Rashid
·
theses.fr (ABES)
Powered wheelchair developed by BRACU students
2016
·
Jaber Al Rashid
Show more works
View as search
Works count:
11
Citation count:
52
H-index:
5
I10-index:
2
Year
Topic
Type