Author

Ji Hee Ryu

Observed name: Ji Hee Ryu

Institution: Kookmin University

Observed institution: Kookmin University

ORCID: 0000-0003-2444-4493

Observed ORCID: 0000-0003-2444-4493

OpenAlex ID: A5087906073

Simultaneous Extraction of Mobility Enhancement Factor and Threshold Voltage With Parasitic Resistances in Amorphous Oxide Semiconductor Thin-Film Transistors

2023 · Ju Young Park, Haesung Kim, et al. · IEEE Transactions on Electron Devices · 10

Extraction Technique for the Conduction Band Minimum Energy in Amorphous Indium–Gallium–Zinc–Oxide Thin Film Transistors

2023 · Haesung Kim, Han Bin Yoo, et al. · IEEE Transactions on Electron Devices · 6

Current-to-transconductance ratio technique for simultaneous extraction of threshold voltage and parasitic resistances in MOSFETs

2021 · Haesung Kim, Han Bin Yoo, et al. · Solid-State Electronics · 6

Alternating Current-Based Technique for Separate Extraction of Parasitic Resistances in MISFETs With or Without the Body Contact

2020 · Haesung Kim, Han Bin Yoo, et al. · IEEE Electron Device Letters · 6

Modeling and characterization of photovoltaic and photoconductive effects in insulated-gate field effect transistors under optical excitation

2021 · Han Bin Yoo, Haesung Kim, et al. · Solid-State Electronics · 3

Capacitance-Based Extraction Technique for the Spatial and Energy Distributions of Traps in Si Mosfets

2023 · Dong Myong Kim, Ji Hee Ryu, et al. · SSRN Electronic Journal

Characterization Technique for Interface Traps in Si Nanosheet GAA MOSFETs through Subthreshold I-V Characteristics

2022 · Han Bin Yoo, Haesung Kim, et al. · IEEE International Conference on Nanotechnology (IEEE-NANO)

Characterization of Spatial Distribution of Trap Across the Substrate in Metal-Insulator-Semiconductor Structure with Band Bending Effect

2021 · Jintae Yu, Han Bin Yoo, et al. · Journal of Nanoscience and Nanotechnology

Deep depletion capacitance–voltage technique for spatial distribution of traps across the substrate in MOS structures

2020 · Han Bin Yoo, Jintae Yu, et al. · Solid-State Electronics

Works count: 9

Citation count: 31

H-index: 4

I10-index: 1