Author

A. Benali

Observed name: Abdellah Benali

ORCID: 0000-0001-9867-8669

Observed ORCID: 0000-0001-9867-8669

OpenAlex ID: A5087915559

2015 · A. Benali, M. Faqir, et al. · Microelectronic Engineering · 25

2014 · A. El Amrani, A. Benali, et al. · Microelectronics Reliability · 18

2013 · A. Benali, M. Bouya, et al. · International Design and Test Workshop (IDT) · 8

2013 · A. Benali, A. El Amrani, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 4

2016 · Kaya Demir, Abdellah Benali, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 3

2015 · A. El Amrani, M. El Bouhali, et al. · International Conference on Electrical and Information Technologies · 3

2013 · A. El Amrani, M. Bouya, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 3

2016 · Kaya Demir, A. Benali, et al. · IEEE Conference Proceedings

1992 · K. Kerroum, A. Benali, et al. · International Wroclaw Symposium and Exhibition on Electromagnetic Compatibility (EMC)

Works count: 9

Citation count: 64

H-index: 4

I10-index: 2