Author

Fanjin Meng

Observed name: Meng, Fanjin
OpenAlex ID: A5088412858
2019 · Haiying Ma, Rui Guo, et al. · IEEE International Test Conference in Asia (ITC-Asia) · 20
2025 · Xu, Fengli, Hao, Qianyue, et al. · arXiv (Cornell University) · 18
2015 · Jiyu Wang, Ruijin Liao, et al. · CSEE Journal of Power and Energy Systems · 13
2018 · Binghua Lu, Selina Sha, et al. · International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) · 3
2020 · Haiying Ma, Ligang Lu, et al. · IEEE International Test Conference (ITC) · 1
2026 · Meng, Fanjin, Ding, Jingtao, et al. · arXiv (Cornell University)
2020 · Huaxing Tang, Allen Yang, et al. · Proceedings - International Symposium for Testing and Failure Analysis
Works count: 11
Citation count: 117
H-index: 4
I10-index: 4
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