Author

Robert B. Comizzoli

Observed names: COMIZZOLI, ROBERT B., COMIZZOLI, ROBERT BENEDICT, Comizzoli, Robert B. jt. auth., Comizzoli,R B, R. B. COMIZZOLI, R. B. Comizzoli, R. Comizzoli, R.B. Comizzoli, Robert B Comizzoli, Robert B. Comizzoli

Observed institutions: AT&T (United States), Princeton University, RCA (United States), Alcatel-Lucent (France)

OpenAlex ID: A5091361722

Electro-optic phase modulation and optical second-harmonic generation in corona-poled polymer films

1988 · K. D. Singer, M. G. Kuzyk, et al. · Applied Physics Letters · 350

Corrosion of Electronic Materials and Devices

1986 · R. B. Comizzoli, R. P. Frankenthal, et al. · Science · 159

Uses of Corona Discharges in the Semiconductor Industry

1987 · R. B. Comizzoli · Journal of The Electrochemical Society · 73

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Passivation Coatings on Silicon Devices

1975 · G. L. Schnable, W. Kern, et al. · Journal of The Electrochemical Society · 46

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Electric Field Quenching of Photoluminescence in Poly‐n‐vinylcarbazole

1972 · ROBERT B. COMIZZOLI · Photochemistry and Photobiology · 38

Anodic oxidation and reliability of MEMS polysilicon electrodes at high relative humidity and high voltages

2000 · Herbert R. Shea, Arman Gasparyan, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 28

Temperature-humidity-bias behavior and acceleration factors for nonhermetic uncooled InP-based lasers

1997 · J.W. Osenbach, T.L. Evanosky, et al. · Journal of Lightwave Technology · 26

Electrophotography—A review

1972 · R.B. Comizzoli, G.S. Lozier, et al. · Proceedings of the IEEE · 26

Corrosion of Electronic Materials and Devices by Submicron Atmospheric Particles

1993 · R. B. Comizzoli, R.P. Frankenthal, et al. · The Electrochemical Society Interface · 20

Degradation of InGaAsP-InP lasers in hot-humid ambients: determination of temperature-humidity-bias acceleration factors

1995 · J.W. Osenbach, R.B. Comizzoli, et al. · IEEE Photonics Technology Letters · 18

Electrical conduction mechanism in semi-insulating polycrystalline silicon films

1987 · R. B. Comizzoli, R. L. Opila · Journal of Applied Physics · 18

Corrosion of Aluminum IC Metaillization with Defective Surface Passivation Layer

1980 · R. B. Comizzoli, L. K. White, et al. · IEEE International Reliability Physics Symposium proceedings · 17

The Detection of Corrosion Phenomena with pH‐Sensitive Fluorescent Dyes on Aluminum‐ and Gold‐Metallized IC Devices

1981 · L. K. White, R. B. Comizzoli, et al. · Journal of The Electrochemical Society · 16

High-reliability 1.3-μm InP-based uncooled lasers in nonhermetic packages

1996 · N. Chand, J.W. Osenbach, et al. · IEEE Journal of Quantum Electronics · 15

New methods for detecting structural defects in glass passivation films

1977 · Werner Kern, R. B. Comizzoli · Journal of Vacuum Science and Technology · 13

Bulk and Surface Conduction in CVD SiO2 and PSG Passivation Layers

1976 · Robert B. Comizzoli · Journal of The Electrochemical Society · 13

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Quantum Efficiency and Photoconductivity in Dye-Sensitized ZnO-Resin Binder Layers

1970 · Robert B. Comizzoli · Journal of Applied Physics · 13

Failure mechanism of avalanche photodiodes in the presence of water vapor

2001 · R.B. Comizzoli, J.W. Osenbach, et al. · Journal of Lightwave Technology · 12

Robust Materials and Processes: Key to Reliability

1990 · Robert B. Comizzoli, James M. Landwehr, et al. · AT&T Technical Journal · 11

The Kuwait Environment and Its Effects on Electronic Materials and Components

1992 · R. B. Comizzoli, J. P. Franey, et al. · Journal of The Electrochemical Society · 10

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CMOS integrated circuit reliability

1981 · George L. Schnable, Robert B. Comizzoli · Microelectronics Reliability · 9

Stress free and moisture insensitive silicon oxide dielectric films formed by molecular-beam deposition

1995 · Naresh Chand, R. R. Kola, et al. · Journal of Applied Physics · 8

Orientationally Ordered Nonlinear Optical Polymer Films

1989 · J. E. Sohn, K. D. Singer, et al. · Springer eBooks · 8

Transverse Electric Field Dependence of Conductivity in Semi‐Insulating Polycrystalline Silicon

1986 · R. B. Comizzoli, H. T. Weston, et al. · Journal of The Electrochemical Society · 8

Fitting of data to a Frenkel-effect model of conduction in insulators

1985 · R. B. Comizzoli · Journal of Applied Physics · 8

Works count: 74

Citation count: 1,050

H-index: 14

I10-index: 20