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Ö. Berkün
Observed name:
Öznur Berkün
Institution:
Zonguldak Bülent Ecevit University
Observed institution:
Zonguldak Bülent Ecevit University
ORCID:
0000-0002-5854-9157
Observed ORCID:
0000-0002-5854-9157
OpenAlex ID:
A5092366486
Evaluation of the current transport mechanism depending on the temperature of Schottky structures with Ti:DLC interlayer
2023
·
E. Erbilen Tanrıkulu
, Ö. Berkün
, et al.
·
Materials Today Communications
·
28
On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer
2023
·
Ö. Berkün
, M. Ulusoy
, et al.
·
Physica B Condensed Matter
·
28
On the Voltage Dependent Series Resistance, Interface Traps, and Conduction Mechanisms in the Al/(Ti-doped DLC)/p-Si/Au Schottky Barrier Diodes (SBDs)
2024
·
Sabreen Hameed
, Öznur Berkün
, et al.
·
Gazi University Journal of Science Part A Engineering and Innovation
·
21
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Works count:
3
Citation count:
77
H-index:
3
I10-index:
3
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