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Davide Baroffio

Observed names: Baroffio, Davide, D. Baroffio
Observed institution: Politecnico di Milano
ORCID: 0009-0007-3112-9869
Observed ORCID: 0009-0007-3112-9869
OpenAlex ID: A5092598615
Enhanced Compiler Technology for Software-based Hardware Fault Detection
2024 · Davide Baroffio, Federico Reghenzani, et al. · ACM Transactions on Design Automation of Electronic Systems · 15
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Compiler-Injected SIHFT for Embedded Operating Systems
2023 · Davide Baroffio, Federico Reghenzani · ACM International Conference on Computing Frontiers (CF) · 6
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Laser Fault Injection Methodology for Software Reliability Testing
2025 · Federico Reghenzani, Davide Baroffio, et al. · IEEE reliability magazine · 4
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RISC-V-Based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters
2023 · William Fornaciari, Federico Reghenzani, et al. · Lecture notes in computer science · 3
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Quantifying Compiler-induced Reliability Loss in Software-Implemented Hardware Fault Tolerance
2026 · Davide Baroffio, Johannes Geier, et al. · Asia and South Pacific Design Automation Conference (ASP-DAC) · 2
Evaluating Compiler-Based Reliability with Radiation Fault Injection
2025 · Davide Baroffio, Tomás Antonio López, et al. · 2
Modern Llvm-Based Compiler Autotuning for Wcet Optimization
2025 · Gabriele Magnani, Davide Baroffio, et al. · Proceedings/Proceedings - Real-Time Systems Symposium · 1
Laser and Radiation Testing of Compiler-Based Protection for Multi-Bit Upsets
2025 · Davide Baroffio, Tomas Antonio López, et al. · Proceedings, IEEE International Conference on Computer Design/Proceedings - IEEE International Conference on Computer Design · 1
Forging Robust Building Blocks for Next-Gen RISC-V Chips: Virtual Repository and IP Card
2026 · Cătălin Bogdan Ciobanu, Francesco Conti, et al. · Euromicro Conference on Digital System Design (DSD)
Late Breaking Results- Proton Beam Experiments of Compiler-based Hardware Fault Tolerance
2026 · Emilio Corigliano, Davide Baroffio, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium
VTS2026 Student Forum:
2026 · Davide Baroffio, Federico Reghenzani, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium
TA11-363: PIT-STOP: Proton Irradiation Testing for SofTware cOmpiler Protection
2026 · Reghenzani, Federico, Baroffio, Davide, et al. · Zenodo (CERN European Organization for Nuclear Research)
Type Deduction Analysis: Reconstructing Transparent Pointer Types in LLVM-IR
2026 · Niccolò Nicolosi, Gabriele Magnani, et al. · ACM SIGPLAN International Conference on Compiler Construction (CC)
Front Matter, Table of Contents, Preface, Conference Organization
2026 · Baroffio, Davide, Busia, Paola, et al. · DROPS (Schloss Dagstuhl – Leibniz Center for Informatics)
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OASIcs, Volume 141, PARMA-DITAM 2026, Complete Volume
2026 · Baroffio, Davide, Busia, Paola, et al. · DROPS (Schloss Dagstuhl – Leibniz Center for Informatics)
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Non-Functional Properties in HPC Systems: Design Exploration of Energy, Power, and Reliability
2025 · G. Agosta, E. Bini, et al. · Euromicro Conference on Digital System Design (DSD)
Software Techniques for Soft Error Resilience: the ASTRAEUS project
2025 · Federico Reghenzani, Davide Baroffio, et al. · Euromicro Conference on Digital System Design (DSD)
Inside ASPIS: Advancing Compiler-based Hardware Fault Tolerance
2025 · E. Corigliano, D. Baroffio, et al. · Virtual Community of Pathological Anatomy (University of Castilla La Mancha)
A laser device to inject Single Event Effects (SEE) in electronics components
2025 · F. Reghenzani, W. Fornaciari, et al. · Virtual Community of Pathological Anatomy (University of Castilla La Mancha)
Works count: 23
Citation count: 34
H-index: 3
I10-index: 1
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