Get started
Author

M. Lejoyeux

Observed names: Lejoyeux, Mickael, Mickael Lejoyeux, Mickaël Lejoyeux
ORCID: 0009-0005-3322-7919
Observed ORCID: 0009-0005-3322-7919
OpenAlex ID: A5092979297
On the insignificance of dislocations in reverse bias degradation of lateral GaN-on-Si devices
2024 · M. Stabentheiner, P. Diehle, et al. · Journal of Applied Physics · 11
PDF
Test concept for a direct correlation between dislocations and the intrinsic degradation of lateral PIN diodes in GaN-on-Si under reverse bias
2023 · M. Stabentheiner, P. Diehle, et al. · Microelectronics Reliability · 3
Doping investigation of structured GaN devices by highly lateral resolved TOF-SIMS
2025 · Patrick Diehle, Stephan Gierth, et al. · Power Electronic Devices and Components · 2
Versatile Gasochromic Hydrogen Detection via Supraparticle‐Based Applied Composite Materials
2026 · Sarah Wenderoth, Maximilian Oppmann, et al. · Advanced Optical Materials · 1
PDF
Novel approach of combined planar and cross-sectional defect analysis of stressed normally-on HEMT devices with leaky Schottky gates
2023 · A. Graff, M. Simon-Najasek, et al. · Microelectronics Reliability · 1
Versatile Gasochromic Hydrogen Detection via Supraparticle‐Based Applied Composite Materials
2026 · Wenderoth, Sarah, Oppmann, Maximilian, et al. · Fraunhofer-Publica (Fraunhofer-Gesellschaft)
Backside Analysis Strategy to Identify a Package-Related Failure Mode at an Automotive Magnetic Sensor Device
2024 · M. Simon-Najasek, F. Naumann, et al. · Journal of Failure Analysis and Prevention
PDF
Backside Analysis Strategy to Identify a Package Related Failure Mode at an Automotive Magnetic Sensor Device
2023 · M. Simon-Najasek, F. Naumann, et al. · Proceedings - International Symposium for Testing and Failure Analysis
Works count: 9
Citation count: 18
H-index: 2
I10-index: 1
Year
Topic
Type