Author

Delsikreo Atchina

Observed institution: Intel (United States)

ORCID: 0009-0005-4627-5469

Observed ORCID: 0009-0005-4627-5469

OpenAlex ID: A5093258532

Memory built-in self-repair and correction for improving yield: a review

2023 · Vijay Sontakke, Delsikreo Atchina · International Journal of Power Electronics and Drive Systems/International Journal of Electrical and Computer Engineering · 6

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Testing nanometer memories: a review of architectures, applications, and challenges

2024 · Vijay Sontakke, Delsikreo Atchina · International Journal of Power Electronics and Drive Systems/International Journal of Electrical and Computer Engineering · 1

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Works count: 2

Citation count: 7

H-index: 1

I10-index: