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Himanshu Marothya

Observed name: Marothya, Himanshu
ORCID: 0009-0001-3248-3890
Observed ORCID: 0009-0001-3248-3890
OpenAlex ID: A5095853134
High-Performance Low-Voltage Thin-Film Transistors: Experimental and Simulation Validation of Atmospheric Pressure Plasma-Assisted Li5AlO4 Metal Oxide Solution Processing
2024 · Anand Sharma, Vishwas Acharya, et al. · ACS Applied Materials & Interfaces · 5
Detection of Defect Density of States in Solution-Processed Quantum Devices
2024 · Himanshu Marothya, Vishwas Acharya, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 4
Burst CV (< 2μs) Measurement System for BTI Analysis of MOS Capacitors
2025 · Himanshu Marothya, Atul Sachan, et al. · IEEE International Reliability Physics Symposium proceedings · 2
Solution Processed ALPO/CdTe-QD/ALPO Gate-Stack-Based Charge Trap Memory Using Burst CV Method
2026 · Himanshu Marothya, Sandip Mondal · IEEE Transactions on Electron Devices · 1
FPGA-NAND Flash Reliability Measurement System to Probe Layer-Dependent Neurocomputing Efficiency
2026 · Asifa Khatun, Himanshu Marothya, et al. · IEEE International Reliability Physics Symposium proceedings
Burst Mode Triangular Pulse CV System for Reliability Analysis of Two-Terminal Multilevel Memory Devices
2026 · Himanshu Marothya, Sandip Mondal · IEEE International Reliability Physics Symposium proceedings
FPGA-Based NAND Flash Reliability Measurement System to Probe Layer-Dependent Neurocomputing Efficiency
2026 · IEEE International Symposium on Reliability Physics 2026, khatun, asifa, et al. · Underline Science Inc.
Burst Mode Triangular Pulse CV System for Reliability Analysis of Two-Terminal Multilevel Memory Devices
2026 · IEEE International Symposium on Reliability Physics 2026, Marothya, Himanshu, et al. · Underline Science Inc.
A Read-Disturb-Free CV Technique for Reliability Characterization of Two-Terminal Memory Devices
2026 · Himanshu Marothya, Sandip Mondal · IEEE Journal of the Electron Devices Society
Gate Metal Dependent Charge Injection in Solution Processed Aluminium Oxide Phosphate
2025 · Atul Sachan, Himanshu Marothya, et al. · IEEE International Conference on Emerging Electronics (ICEE)
High Speed CV Measurement System for Evaluating Reliability of Two-terminal Flash Memory Devices
2025 · Himanshu Marothya, Sandip Mondal · IEEE International Conference on Emerging Electronics (ICEE)
Temperature Coefficient of Read Reference Voltage in NAND Flash Memory Under Thermal Stress
2025 · Dharmendra Kumar Singh, Siva Chittiboina, et al. · IEEE International Conference on Emerging Electronics (ICEE)
Digital Probing of Activation Energy for Evaluating Reliability in 2-D and 3-D NAND Flash Memory
2025 · Dharmendra Kumar Singh, Himanshu Marothya, et al. · IEEE Transactions on Device and Materials Reliability
Reliability Correlation Coefficient of Fail Bit Counts of Flash Memory
2025 · Dharmendra Kumar Singh, Himanshu Marothya, et al. · IEEE Transactions on Device and Materials Reliability
Impact of Doping Profile Engineering for Enhanced Performance in Nanosheet Field Effect Transistors
2025 · Akansha Aggarwal, Gagan, et al. · IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI)
β-Ga2O3 Based Bulk-Planar Junctionless Transistor for Superior Electrostatic Integrity at Sub-7nm Technology
2024 · Gagan, Akansha Aggarwal, et al. · IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI)
High-performance IZTO TFTs using solution-processed ion-conducting dielectric
2024 · Vishwas Acharya, Anand Sharma, et al. · AIP conference proceedings
Works count: 19
Citation count: 14
H-index: 2
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