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Kilian Kirchhoff

Observed names: K. Kirchhoff, Kirchhoff, Kilian
Observed institution: TTTech Computertechnik (Austria)
ORCID: 0009-0003-1596-0493
Observed ORCID: 0009-0003-1596-0493
OpenAlex ID: A5099587147
Measuring and characterizing the diffractive component in display reflection
2025 · Ingo Rotscholl, Kilian Kirchhoff, et al. · Journal of the Society for Information Display · 5
Compact metrology for AR projectors and AR devices
2026 · K. Kirchhoff, A. Voelz, et al. · Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) · 1
Analysis of Halo Perception and Its Impact on Setup Requirements in the Context of Mask-Free Measurements
2024 · Ingo Rotscholl, Ramazan Ayasli, et al. · Proceedings of the International Display Workshops · 1
83‐1: Understanding and Optimizing Lens Performance in AR Display Metrology
2026 · Ingo Rotscholl, Bob Liu, et al. · SID Symposium Digest of Technical Papers
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Goniometric Measurements Using Photometric Robots With Imaging Luminance Measurement Devices (ILMDs)
2026 · Kilian Kirchhoff, Ingo Rotscholl, et al. · Journal of the Society for Information Display
26‐1: Recent Developments in Photometric Robotics
2025 · Kilian Kirchhoff, Ingo Rotscholl, et al. · SID Symposium Digest of Technical Papers
27‐2: Invited Paper: Reproducible Characterization of Microdisplays using Imaging Luminance Measurement Devices (ILMDs)
2024 · Ingo Rotscholl, Kilian Kirchhoff, et al. · SID Symposium Digest of Technical Papers
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Works count: 9
Citation count: 7
H-index: 1
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