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Jian Li
Observed name:
Li, Jian; Levi, Dean; Contreras, Miguel; Glynn, Stephen
Institution:
Institute of Semiconductors
Observed institutions:
Natural Resources Canada,
Henan University of Science and Technology,
Institute of Semiconductors,
Fibics (Canada),
University of Virginia,
University of Toledo
show all 6
ORCID:
0000-0001-6533-5504
Observed ORCID:
0000-0001-6533-5504
OpenAlex ID:
A5100402403
Copper device editing: Strategy for focused ion beam milling of copper
2002
·
J. David Casey
, Michael Phaneuf
, et al.
·
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
·
31
Research on Grinding Parameters Optimization Method of CNC Grinding Machine Based on Black Hole-Continuous Ant Colony Algorithm
2022
·
Huankun Li
, Liping Xu
, et al.
·
IEEE Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)
·
2
Research on the Distribution Rule of Percussion Response Pulse Width in Coin‐Tap Test
2021
·
Jian Li
, Liping Xu
, et al.
·
Shock and Vibration
·
2
PDF
Advanced sub 0.13µm Cu Devices – Failure Analysis and Circuit Edit With Improved FIB Chemical Processes and Beam Characteristics
2002
·
J. David Casey
, Thomas J. Gannon
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
2
Rapid and facile characterization of dislocations in cross-sectional GaAs/Si films using electron channeling contrast imaging
2023
·
Chen Jiang
, Hao Liu
, et al.
·
Applied Optics and Photonics China (AOPC): Optoelectronics and Nanophotonics
·
1
Modeling and analysis of web tension between two adjacent printing rollers in shaft-less drive gravure printing systems
2017
·
Kui He
, Kedian Wang
, et al.
·
IEEE Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)
·
1
Dielectric Function and Defect Structure of CdTe Implanted by 350-keV Bi Ions
2008
·
Peter Petrik
, Miklós Fried
, et al.
·
MRS Proceedings
·
1
Characterization of Ultrathin Strained-Si Channel Layers of n-MOSFETs Using Transmission Electron Microscopy
2005
·
Dalaver H. Anjum
, Jian Li
, et al.
·
MRS Proceedings
·
1
In situ optical diagnostic for monitoring or control of sodium diffusion in photovoltaics manufacturing
2023
·
Li, Jian; Levi, Dean; Contreras, Miguel; Glynn, Stephen
·
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Commentary—Are There Still Places for Gallium FIB?
2019
·
Jian Li
·
The minerals, metals & materials series
On FIB Milling Parameters
2018
·
Jian Li
, Pei Liu
·
The minerals, metals & materials series
Dielectric Function and Defect Structure of CdTe Implanted by 350-keV Bi Ions
2008
·
Peter Petrik
, Fried Miklos
, et al.
·
MRS Proceedings
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Works count:
12
Citation count:
41
H-index:
2
I10-index:
1
Year
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