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Yuwei Liu

Revealing Unusual Bandgap Shifts with Temperature and Bandgap Renormalization Effect in Phase‐Stabilized Metal Halide Perovskite Thin Films
2023 · Haochen Zhang, Zhixuan Bi, et al. · Advanced Functional Materials · 70
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Investigation of Low-Temperature Cu–Cu Direct Bonding With Pt Passivation Layer in 3-D Integration
2021 · Demin Liu, Tsung-Yi Kuo, et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 53
Low-Temperature (70°C) Cu-to-Cu Direct Bonding by Capping Metal Layers
2021 · Demin Liu, Po-Chih Chen, et al. · IEEE Electron Device Letters · 29
Hot-Carrier-Induced Degradations and Optimizations for Lateral DMOS Transistor With Multiple Floating Poly-Gate Field Plates
2017 · Siyang Liu, Xiaofei Ren, et al. · IEEE Transactions on Electron Devices · 25
Monolithic 3D BEOL FinFET switch arrays using location-controlled-grain technique in voltage regulator with better FOM than 2D regulators
2019 · Ping-Yi Hsieh, Chien-Chi Huang, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 22
Investigation of Pillar–Concave Structure for Low-Temperature Cu–Cu Direct Bonding in 3-D/2.5-D Heterogeneous Integration
2020 · Tzu-Chieh Chou, Kai-Ming Yang, et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 21
Lateral DMOS With Partial-Resist-Implanted Drift Region for Alleviating Hot-Carrier Effect
2017 · Siyang Liu, Sheng Li, et al. · IEEE Transactions on Device and Materials Reliability · 20
Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor
2014 · Weifeng Sun, Chunwei Zhang, et al. · IEEE Electron Device Letters · 10
Understanding of the excess channel noise in InAlAs∕InGaAs∕InP high electron mobility transistors in impact ionization regime
2007 · Hong Wang, Yuwei Liu, et al. · Applied Physics Letters · 9
Experimental evidence for dislocation-related gettering in metamorphic InP∕InGaAs high electron mobility transistor (HEMT) structures on GaAs substrate
2006 · Yuwei Liu, Hong Wang · Journal of Applied Physics · 9
Single-Crystal Islands (SCI) for Monolithic 3-D and Back-End-of-Line FinFET Circuits
2021 · Yu-Wei Liu, Han-Wen Hu, et al. · IEEE Transactions on Electron Devices · 8
Influence of Latch-Up Immunity Structure on ESD Robustness of SOI-LIGBT Used As Output Device
2018 · Ran Ye, Siyang Liu, et al. · IEEE Transactions on Device and Materials Reliability · 7
Effect of Crystallinity on the Electrical Characteristics of Poly-Si Tunneling FETs via Green Nanosecond Laser Crystallization
2021 · Hao-Tung Chung, Chun-Ting Chen, et al. · IEEE Electron Device Letters · 6
Hot-Carrier-Induced Degradation and Optimization for 700-V High-Voltage Lateral DMOS by the AC Stress
2020 · Siyang Liu, Li Lu, et al. · IEEE Transactions on Electron Devices · 6
Increase in electron mobility of InGaAs/InP composite channel high electron mobility transistor structure due to SiN passivation
2006 · Yuwei Liu, Hong Wang, et al. · Thin Solid Films · 6
Crystal-Orientation-Tolerant Voltage Regulator using Monolithic 3D BEOL FinFETs in Single-Crystal Islands for On-Chip Power Delivery Network
2020 · Po-Tsang Huang, Yu-Wei Liu, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 5
Duty-cycle-accelerated hot-carrier degradation and lifetime evaluation for 700V lateral DMOS
2018 · Siyang Liu, Zhichao Li, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 5
Structural properties of ultra-thin Y2O3 gate dielectrics studied by X-Ray diffraction (XRD) and X-Ray photoelectron spectroscopy (XPS)
2010 · Chuan-Hsi Liu, Pi-Chun Juan, et al. · 3
Effect of rapid thermal annealing on the optical and electrical properties of metamorphic high electron mobility transistor structures with composite InGaAs∕InP channel
2006 · Yuwei Liu, Hong Wang · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2
Polarity dependent of gate oxide breakdown from measurements
2013 · Shili Wu, Xiaowei He, et al. · IEEE International Conference on ASIC (ASICON) · 1
The recovery effect of hot-carrier degradation under dynamic stress condition for SOI-nLDMOS device
2013 · Chunwei Zhang, Siyang Liu, et al. · IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) · 1
Channel noise in InGaAs/InP composite channel high electron mobility transistors (HEMTs)
2008 · Hong Wang, Yuwei Liu · Conference proceedings. ... International Conference on Indium Phosphide and Related Materials · 1
Influence of silicon nitride passivation on transport properties in InAlAs∕InGaAs∕InP composite channel high electron mobility transistor structures
2006 · Yuwei Liu, Hong Wang · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1
Broadband Silicon Photonics Mode-Division-Multiplexing Grating Coupler
2024 · Shao-Ru Lin, Yi-Jang Hsu, et al. · Wireless and Optical Communications Conference
Dispersion Engineered Silicon Photonic Micro-Ring Resonator by Subwavelength Waveguiding Structures
2024 · Yi-Min Wang, Yi-Jang Hsu, et al. · Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)
Works count: 35
Citation count: 320
H-index: 9
I10-index: 8
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