Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Xijiang Lin
Observed name:
Lin Xijiang
Observed institutions:
University of Iowa,
Affiliated Hospital of Qingdao University,
Mentor Graphics (United States)
OpenAlex ID:
A5100539528
Novel techniques for achieving high at-speed transition fault test coverage for Motorola's microprocessors based on PowerPC/spl trade/ instruction set architecture
2003
·
N. Tendolkar
, R. Raina
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
74
On finding undetectable and redundant faults in synchronous sequential circuits
2002
·
Xijiang Lin
, I. Pomeranz
, et al.
·
IEEE International Conference on Computer Design: VLSI in Computers and Processors (ICCD)
·
37
MIX: a test generation system for synchronous sequential circuits
2002
·
Xijiang Lin
, I. Pomeranz
, et al.
·
International Conference on VLSI Design
·
35
SIFAR: static test compaction for synchronous sequential circuits based on single fault restoration
2002
·
Xijiang Lin
, Wu-Tung Cheng
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
24
The Stability and Survival Rate of Dental Implants After Preparation of the Site by Piezosurgery vs Conventional Drilling: A Systematic Review and Meta-Analysis
2020
·
Xiaoni Li
, Xijiang Lin
, et al.
·
The International Journal of Oral & Maxillofacial Implants
·
20
Techniques for improving the efficiency of sequential circuit test generation
2003
·
Xijiang Lin
, I. Pomeranz
, et al.
·
International Conference on Computer Aided Design
·
7
Full scan fault coverage with partial scan
2003
·
Xijiang Lin
, I. Pomeranz
, et al.
·
Design, Automation, and Test in Europe
·
5
DFT for Complex Designs and Test Data Management
2024
·
Wu Yang
, Jinshan Yu
, et al.
·
IEEE International Test Conference in Asia (ITC-Asia)
·
1
Test generation for designs with multiple clocks
2003
·
Xijiang Lin
, Rob Thompson
·
ACM/IEEE Design Automation Conference (DAC)
·
1
Low-Power Testing for 2D/3D Devices and Systems
2018
·
Lin Xijiang
, Wen Xiaoqing
, et al.
·
CRC Press eBooks
Timing-Aware ATPG
2017
·
Kassab Mark
, Nadeau-Dostie Benoit
, et al.
·
CRC Press eBooks
テストパターン選択によるを達成する最大鎖診断分解能について【Powered by NICT】
2016
·
Xijiang Lin
, M. Sudhakar
, et al.
·
IEEE Conference Proceedings
A Study for Preventing Injury of Inferior Alveolar Nerve in Dental Implant
2001
·
Xijiang Lin
·
Acta Academiae Medicinae Qingdao Universitatis
ya gen zong zhe de wu zhen yu wu zhi 45 li fen xi
2001
·
Cui Di
, Xijiang Lin
, et al.
Show more works
View as search
Works count:
14
Citation count:
204
H-index:
6
I10-index:
5
Year
Topic
Type