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Yu Li
Observed names:
Li Yu,
Li, Yu,
Yu LI
Institution:
Zhejiang University
Observed institutions:
Peking University,
Meta (United States),
Massachusetts Institute of Technology,
Zhejiang University,
Tsinghua University
ORCID:
0000-0003-4791-7310
Observed ORCIDs:
0000-0003-4791-7310,
0000-0001-9122-5923,
0000-0002-4975-4896,
0000-0002-0722-4408
OpenAlex ID:
A5100754132
Methodology for analysis of TSV stress induced transistor variation and circuit performance
2012
·
Li Yu
, Wen-Yao Chang
, et al.
·
International Symposium on Quality Electronic Design (ISQED)
·
23
Remembrance of Transistors Past
2014
·
Li Yu
, Sharad Saxena
, et al.
·
ACM/IEEE Design Automation Conference (DAC)
·
14
Statistical Library Characterization using Belief Propagation across Multiple Technology Nodes
2015
·
Li Yu
, Sharad Saxena
, et al.
·
Design, Automation, and Test in Europe
·
12
Statistical Modeling with the Virtual Source MOSFET Model
2013
·
Li Yu
, Lan Wei
, et al.
·
Design, Automation, and Test in Europe
·
12
Compact Model Parameter Extraction Using Bayesian Inference, Incomplete New Measurements, and Optimal Bias Selection
2016
·
Li Yu
, Sharad Saxena
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
9
Statistical library characterization using belief propagation across multiple technology nodes
2015
·
Yu Li
, Sharad Saxena
, et al.
·
7
Efficient performance estimation with very small sample size via physical subspace projection and maximum a posteriori estimation
2014
·
Li Yu
, Sharad Saxena
, et al.
·
Design, Automation, and Test in Europe
·
5
A Novel Approach to Reducing Testing Costs and Minimizing Defect Escapes Using Dynamic Neighborhood Range and Shapley Values
2025
·
Tianming Ni
, Wangsheng Rui
, et al.
·
ACM Transactions on Design Automation of Electronic Systems
·
4
An ultra-compact virtual source FET model for deeply-scaled devices: Parameter extraction and validation for standard cell libraries and digital circuits
2013
·
Li Yu
, O. Mysore
, et al.
·
Asia and South Pacific Design Automation Conference (ASP-DAC)
·
4
PDF
An ultra-compact virtual source FET model for deeply-scaled devices: Parameter extraction and validation for standard cell libraries and digital circuits
2013
·
Yu Li
, Omar Mysore
, et al.
·
4
When Device Modeling Meets Machine Learning: Opportunities and Challenges (Invited)
2024
·
Lining Zhang
, Baokang Peng
, et al.
·
ACM/IEEE Workshop on Machine Learning for CAD (MLCAD)
·
3
When Device Modeling Meets Machine Learning: Opportunities and Challenges (Invited)
2024
·
Lining Zhang
, Baokang Peng
, et al.
·
ACM/IEEE Workshop on Machine Learning for CAD (MLCAD)
·
3
Comprehensive Understanding of Flicker Noise in Advanced FinFET Technology: from Noise Sources Separation to Physical-based Modeling
2023
·
Junjie Wu
, Pengpeng Ren
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
3
Statistical Modeling with the Virtual Source MOSFET Model
2013
·
Li Yu
, Lan Wei
, et al.
·
3
Efficient performance estimation with very small sample size via physical subspace projection and maximum a posteriori estimation
2014
·
Li Yu
, Sharad Saxena
, et al.
·
Design, Automation, and Test in Europe
·
2
A concisely asymmetric modeling of double-π equivalent circuit for on-chip spiral inductors
2010
·
Li Yu
, Yang Tang
, et al.
·
Solid-State Electronics
·
2
A Dynamic Time Evolution Method for Accelerating Self-Heating Simulations of Advanced Technologies
2025
·
Yu Li
, Sihao Chen
, et al.
·
IEEE Transactions on Electron Devices
·
1
TrainSDC: Characterizing and Mitigating Silent Data Corruption in Large Language Model Training
2026
·
Xia, Zhipeng
, Xu, Haotian
, et al.
·
arXiv (Cornell University)
PDF
VClare: Resolving Imperfect Specifications in LLM-Based Verilog Generation
2026
·
Zhao, Zhuorui
, Li, Bing
, et al.
·
arXiv (Cornell University)
PDF
LithoDreamer: A Physics-Informed World Model for Multi-Stage Computational Lithography
2026
·
Jiang, Yuqi
, Liu, Yumeng
, et al.
·
arXiv (Cornell University)
PDF
Large models for integrated circuits: driving leapfrogging advances in IC manufacturing technologies
2026
·
Qi SUN
, Jinyuan DENG
, et al.
·
Scientia Sinica Informationis
PDF
A Scalable Machine Learning based Device Model with Mixture-of-Expert Neural Networks for Enhanced Accuracy and Efficiency
2025
·
Yuxiang Zhou
, Baokang Peng
, et al.
·
International Symposium of Electronics Design Automation (ISEDA)
Efficient performance estimation with very small sample size via physical subspace projection and maximum a posteriori estimation
2014
·
Li Yu
, Sharad Saxena
, et al.
·
Design, Automation, and Test in Europe
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Works count:
23
Citation count:
111
H-index:
6
I10-index:
4
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