Author

Chih‐Hung Chen

Observed names: CHIH-HUNG CHEN, Chen, Chih-Hung, Chih-Hung Chen, Chih-Hung Chen Chih-Hung Chen, Chih-hung Chen
Institution: McMaster University
ORCID: 0000-0001-5236-6272
Observed ORCID: 0000-0001-5236-6272
OpenAlex ID: A5100759680
2006 · Juan C. Ranuárez, M.J. Deen, et al. · Microelectronics Reliability · 200
2002 · Xiaodong Jin, Jia-Jiunn Ou, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 167
2018 · Sumit Majumder, Leon Chen, et al. · IEEE Reviews in Biomedical Engineering · 165
2002 · Chih-Hung Chen, M.J. Deen · IEEE Transactions on Electron Devices · 151
2001 · Chih-Hung Chen, M.J. Deen, et al. · IEEE Transactions on Electron Devices · 122
2017 · Yiheng Qin, Arif U. Alam, et al. · Sensors and Actuators B Chemical · 116
2002 · Yuhua Cheng, Chih-Hung Chen, et al. · IEEE Transactions on Electron Devices · 82
2007 · Saman Asgaran, M. Jamal Deen, et al. · IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications · 71
2006 · S. Asgaran, M.J. Deen, et al. · IEEE Microwave and Wireless Components Letters · 57
2009 · Ming-Ching Kuo, Shiau-Wen Kao, et al. · IEEE Journal of Solid-State Circuits · 47
2005 · Sasan Naseh, M. Jamal Deen, et al. · Microelectronics Reliability · 40
2005 · S. Naseh, M.J. Deen, et al. · IEEE Transactions on Device and Materials Reliability · 39
2003 · M.J. Deen, Chih-Hung Chen, et al. · IEEE Custom Integrated Circuits Conference (CICC) · 35
2007 · Saman Asgaran, M. Jamal Deen, et al. · IEEE Journal of Solid-State Circuits · 32
2018 · Xuesong Chen, Chih-Hung Chen, et al. · IEEE Transactions on Electron Devices · 31
2023 · Nooshin Valizade Shahmirzadi, Vartika Tyagi, et al. · IEEE Transactions on Antennas and Propagation · 29
2008 · Chih-Hung Chen, Ying-Lien Wang, et al. · IEEE Transactions on Instrumentation and Measurement · 26
2017 · Priyanka Mandal, Krishna Tank, et al. · IEEE Journal of Biomedical and Health Informatics · 24
2002 · Chih-Hung Chen, M.J. Deen, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 22
2021 · Xuesong Chen, Hazem Elgabra, et al. · IEEE International Symposium on Circuits and Systems proceedings · 21
2005 · J.C. Ranuarez, M.J. Deen, et al. · IEEE Electron Device Letters · 20
2007 · Chih-Hung Chen, Wei-Hsu Chang, et al. · Proceedings of the Annual Conference of the IEEE Industrial Electronics Society · 18
2010 · Yih-Shyang Cheng, Yuan-Tien Su, et al. · Optics Express · 17
Works count: 90
Citation count: 1,779
H-index: 21
I10-index: 31
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