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Yifei Luo
Observed names:
Y. L. Luo,
Yi‐Fei Luo
Institution:
Naval University of Engineering
Observed institutions:
Xihua University,
Agency for Science, Technology and Research,
Georgia Institute of Technology,
Guangdong University of Technology,
University of Electronic Science and Technology of China,
Naval University of Engineering,
Institute of Materials Research and Engineering
show all 7
ORCID:
0000-0003-0848-8605
Observed ORCIDs:
0000-0003-0848-8605,
0009-0007-1848-7418
OpenAlex ID:
A5100785140
Lifting-Off of Al Bonding Wires in IGBT Modules Under Power Cycling: Failure Mechanism and Lifetime Model
2019
·
Yongle Huang
, Yingjie Jia
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
99
Failure Mechanism of Die-Attach Solder Joints in IGBT Modules Under Pulse High-Current Power Cycling
2018
·
Yongle Huang
, Yifei Luo
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
75
PSpice-COMSOL-Based 3-D Electrothermal–Mechanical Modeling of IGBT Power Module
2019
·
Yingjie Jia
, Fei Xiao
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
71
Fatigue Mechanism of Die-Attach Joints in IGBTs Under Low-Amplitude Temperature Swings Based on 3D Electro-Thermal-Mechanical FE Simulations
2020
·
Yongle Huang
, Hongfei Deng
, et al.
·
IEEE Transactions on Industrial Electronics
·
52
Real-Time and Rapid Food Quality Monitoring Using Smart Sensory Films with Image Analysis and Machine Learning
2022
·
Karyn Pounds
, Hanxi Bao
, et al.
·
ACS Food Science & Technology
·
41
A Lumped-Charge Approach Based Physical SPICE-Model for High Power Soft-Punch Through IGBT
2018
·
Yaoqiang Duan
, Fei Xiao
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
37
Online Diagnosis Method for Open-Circuit Fault of NPC Inverter Based on 1D-DSCNN-GMP Lightweight Edge Deployment
2023
·
Feng Xie
, Xin Tang
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
34
A Physics-Based Transient Electrothermal Model of High-Voltage Press-Pack IGBTs Under HVdc Interruption
2019
·
Yifei Luo
, Fei Xiao
, et al.
·
IEEE Transactions on Power Electronics
·
32
A Multi-timescale Prediction Model of IGBT Junction Temperature
2018
·
Binli Liu
, Fei Xiao
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
31
Online Open-Circuit Fault Diagnosis for Neutral Point Clamped Inverter Based on an Improved Convolutional Neural Network and Sample Amplification Method Under Varying Operating Conditions
2024
·
Haolan Shen
, Xin Tang
, et al.
·
IEEE Transactions on Instrumentation and Measurement
·
27
Evaluation of the Degradation in Electrothermal Characteristics of IGBTs During Thermal Cycling Cocaused by Solder Cracking and Al-Wires Lifting-Off Based on Iterative Looping
2022
·
Yongle Huang
, Yifei Luo
, et al.
·
IEEE Transactions on Power Electronics
·
23
Simulation of anaerobic co-digestion of steam explosion pulping wastewater with cattle manure: Focusing on degradation and inhibition of furfural
2023
·
Pengfei Li
, Xinyu Wei
, et al.
·
Bioresource Technology
·
18
Temporal and Spatial Differences in Thermal Transfer Behavior of IGBTs Caused by the Baseplate and Die-Attach Solder Cracking
2022
·
Yongle Huang
, Yifei Luo
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
18
A Reduced-Order Decoupling Method Applied to Efficient Junction Temperature Simulation Model in Multichip Devices
2023
·
Tongyao Han
, Yifei Luo
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
17
Convenient synthesis of phthalonitrile‐containing mono‐benzoxazines with exceptional thermal stability and improved curing activity
2024
·
Shuai Zhang
, Yike Wang
, et al.
·
Journal of Applied Polymer Science
·
14
A Physics-Based Lumped-Charge Model for SiC MPS Diode Implemented in PSPICE
2019
·
Yaoqiang Duan
, Fei Xiao
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
14
Stray Inductance Extraction of High-Power IGBT Dynamic Test Platform and Verification of Physical Model
2018
·
Xin Li
, Yifei Luo
, et al.
·
IEEE International Power Electronics and Application Conference and Exposition (PEAC)
·
14
Temperature monitoring inside IGBT modules at forward bias from the cross section and its finite element analysis
2018
·
Yongle Huang
, Yifei Luo
, et al.
·
Microelectronics Reliability
·
13
A Voltage Model of p-i-n Diodes at Reverse Recovery Under Short-Time Freewheeling
2016
·
Yifei Luo
, Fei Xiao
, et al.
·
IEEE Transactions on Power Electronics
·
13
Degradation State Assessment of IGBT Module Based on Interpretable LSTM-AE Modeling Under Changing Working Conditions
2024
·
Feng Xie
, Fei Xiao
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
12
A Lumped-Charge Model for High-Power PT-p-i-n Diode With a Buffer Layer
2019
·
Xin Li
, Yifei Luo
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
12
Numerical modeling of FS-trench IGBTs by TCAD and its parameter extraction method
2023
·
Xiao Ma
, Yongle Huang
, et al.
·
Microelectronics Reliability
·
11
Modeling method for electrothermal cosimulation of high‐power IGBT
2019
·
Ying‐Jie Jia
, Fei Xiao
, et al.
·
IEEJ Transactions on Electrical and Electronic Engineering
·
11
Analysis and Modeling of SiC MPS Diode and Its Parasitic Oscillation
2019
·
Xin Li
, Fei Xiao
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
10
An Improved Physical Model of Power Diode in the Rectifier Circuit
2021
·
Zenan Shi
, Yifei Luo
, et al.
·
IEEE Journal of Emerging and Selected Topics in Power Electronics
·
9
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Works count:
64
Citation count:
786
H-index:
14
I10-index:
24
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