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J.H. Oh

Observed names: G.H. Koh, J. H. OH, J. H. Oh, Ji-hwan Oh, Jiseong Oh, Jongwon Oh
Institution: Sogang University
ORCID: 0000-0003-0205-6748
Observed ORCID: 0000-0003-0205-6748
OpenAlex ID: A5101190473
Full Integration of Highly Manufacturable 512Mb PRAM based on 90nm Technology
2006 · J.H. Oh, J.H. Park, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 155
Highly reliable 50nm contact cell technology for 256Mb PRAM
2005 · S.J. Ahn, Y.N. Hwang, et al. · Symposium on VLSI Technology · 73
3.5: Invited Paper: Recent Progress in Large Sized & High Performance Organic TFT Array
2005 · M. P. Hong, B. S. Kim, et al. · SID Symposium Digest of Technical Papers · 19
Full Integration of Highly Reliable Phase Change Memory With Advanced Ring Type Bottom Electrode Contact
2007 · J. M. SHIN, Y. J. SONG, et al. · Integrated ferroelectrics · 4
Eco-friendly solvent engineering for high-performance solution-processed organic thin-film transistors
2025 · Jinyeob Kim, Junyeop Yoo, et al. · Surfaces and Interfaces · 2
Investigation of Seismic Responses of Single- and Bi-Directional Traffic Light Poles
2022 · Taehyeon Kim, Sanghyun Hong, et al. · Journal of the Earthquake Engineering Society of Korea · 2
Phase-behavior-dependent thin-film structure and charge transport in dithienothiophene-based small-molecule semiconductors for organic field-effect transistors
2026 · Yeeun Lee, Eunjeong Lee, et al. · Synthetic Metals
Tilted twin boundaries govern ultrafast supersonic elastic shock waves in Cu(111) thin films
2026 · Hyunjung Kim, Sung Soo Ha, et al. · Research Square
High Performance Flip-Flop Design Using a New Output Latch Scheme in Samsung 2nm GAA Process
2025 · Ji-hwan Oh, Ah-reum Kim, et al. · IEEE International System-on-Chip Conference (SOCC)
Works count: 10
Citation count: 328
H-index: 4
I10-index: 4
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