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Wei-Tung Lin
Observed name:
Lin, Wei-Tung
Institution:
National Yang Ming Chiao Tung University
Observed institution:
National Yang Ming Chiao Tung University
OpenAlex ID:
A5101378704
Threshold Voltage Bias Temperature Instability of RF MIS-HEMTs and Schottky HEMTs Under Semi-On State Stress
2025
·
Meng-Che Tsai
, Ying-Chun Kuo
, et al.
·
IEEE Transactions on Electron Devices
·
3
Toward Understanding Stability of RF MIS-HEMTs Under ON/SEMI-ON/OFF-State Pulses with Scaling in-situ SiN Thicknesses
2025
·
Yi Yang
, Hao Yu
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
3
Hole Generation Triggered Dynamic Drain Induced Barrier Lowering of RF GaN MIS-HEMTs
2026
·
Yi Yang
, Hao Yu
, et al.
·
IEEE Electron Device Letters
Fabrication of Hollow ZIF-8 Nanocrystals with Aqueous Cu 2+ Incorporation for Chemisorptive Methylene Blue Capture
2026
·
Wei-Tung Lin
, Yan-Ting Ye
, et al.
·
ACS Applied Nano Materials
PDF
Understanding Gate Breakdown Mechanisms in RF GaN MIS-HEMTs with thin gate SiN
2026
·
Anna Navolotskaia
, Hao Yu
, et al.
·
IEEE International Reliability Physics Symposium proceedings
Understanding Gate Breakdown Mechanisms in RF GaN MISHEMTs with thin gate SiN
2026
·
IEEE International Symposium on Reliability Physics 2026
, Alian, AliReza
, et al.
·
Underline Science Inc.
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Works count:
6
Citation count:
6
H-index:
2
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