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Debika Das
Institution:
Gauhati University
Observed institutions:
Gauhati University,
National Institute Of Technology Silchar
ORCID:
0000-0002-4059-382X
Observed ORCID:
0000-0002-4059-382X
OpenAlex ID:
A5101625786
Effect of dielectric pocket for controlling ambipolar conduction in TFET and analysis of noise and temperature sensitivity
2021
·
Debika Das
, Ujjal Chakraborty
·
Indian Journal of Physics
·
24
Impact of temperature on RF characteristics and electrical noise analysis of an L‐shaped gate tunnel FET with hetero‐stacked source configuration
2020
·
Debika Das
, Srimanta Baishya
, et al.
·
International Journal of RF and Microwave Computer-Aided Engineering
·
19
PDF
A Study on Dual Dielectric Pocket Heterojunction SOI Tunnel FET Performance and Flicker Noise Analysis in Presence of Interface Traps
2020
·
Debika Das
, Ujjal Chakraborty
·
Silicon
·
14
Three‐dimensional star antenna for wearable defense application
2022
·
Pranjal Borah
, Debika Das
·
Microwave and Optical Technology Letters
·
5
Investigation of Interface Trap Charges and Temperature on RF Performance with Noise Analysis for IoT Application of a Heterojunction Tunnel FET
2022
·
Debika Das
, Ujjal Chakraborty
·
Chapman & Hall/CRC eBooks
·
2
Electrical noise, temperature fluctuations and sensitivity of a vertical TFET based biosensor with dielectric pocket under the influence of interface trap charges
2026
·
Debika Das
, Lachit Dutta
, et al.
·
Discover Electronics
·
1
PDF
Design and sensitivity analysis of a vertical TFET with dielectric pocket for its use as label free biosensor
2024
·
Debika Das
, Ujjal Chakraborty
, et al.
·
Engineering Research Express
·
1
Impact of Temperature and Trap Charges on Heterojunction Tunnel FET
2020
·
Debika Das
, Raju Pandey
, et al.
·
National Conference on Emerging Trends on Sustainable Technology and Engineering Applications (NCETSTEA)
·
1
Design and performance analysis of a hetero-dielectric gate TFET based photo sensor for visible light detection
2026
·
Debika Das
, Lachit Dutta
, et al.
·
Engineering Research Express
Interface trap-induced radiofrequency and low-frequency noise analysis under temperature variation of a heterostacked source L-gate tunnel field effect transistor
2024
·
Debika Das
, Ujjal Chakraborty
, et al.
·
Semiconductor Science and Technology
Investigation of Electrical Parameters and Low-Frequency Noise Analysis of a Heterojunction TFET
2021
·
Debika Das
, Srimanta Baishya
, et al.
·
Lecture notes in electrical engineering
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Works count:
11
Citation count:
67
H-index:
4
I10-index:
3
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