Author

Takahiro Sato

Observed names: T Sato, T. SATO, T. Sato, Takahiro SATO

Institutions: Nikken Sekkei (Japan), Research Institute for Economics & Business Administration, Kobe University, Kobe University

Observed institutions: Tokyo Medical and Dental University, Central Research Institute of Electric Power Industry, Chiba University, TDK (Japan), Keio University, Kyoto Institute of Technology, Japan Broadcasting Corporation (Japan), Nikken Sekkei (Japan), Hitachi High-Tech (Japan), Biomaster, Inc. (Japan), Research Institute for Economics & Business Administration, Kobe University, Hitachi (Japan), Kobe University

ORCID: 0000-0003-2352-5523

Observed ORCID: 0000-0003-2352-5523

OpenAlex ID: A5101696186

Hydrogenolysis of Furfural into 1,5-Pentanediol by Employing Ni-M (M = Y or La) Composite Catalysts

2017 · Husni Wahyu Wijaya, Takahiro Sato, et al. · Chemistry Letters · 35

Unusual hardening in Ti/Al2O3 nanocomposites produced by high-pressure torsion followed by annealing

2011 · Kaveh Edalati, Hideaki Iwaoka, et al. · Materials Science and Engineering A · 28

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Low damage lamella preparation of metallic materials by FIB processing with low acceleration voltage and a low incident angle Ar ion milling finish

2020 · T. SATO, Y. AIZAWA, et al. · Journal of Microscopy · 20

An experimental study of the thermodynamic properties of 1,1-difluoroethane

1992 · T. Tamatsu, T. Sato, et al. · International Journal of Thermophysics · 20

24 mΩcm/sup 2/ 680 V silicon superjunction MOSFET

2003 · Y. Onishi, S. Iwamoto, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 18

High quality lamella preparation of gallium nitride compound semiconductor using Triple Beam™ system

2017 · T Sato, K Nakano, et al. · Journal of Physics Conference Series · 15

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Dislocation Analysis of 4H-SiC Using KOH Low Temperature Etching

2014 · Takahiro Sato, Yuya Suzuki, et al. · Materials science forum · 6

On-Chip Evaluation of Damage on Cell Surfaces Induced by Cell Dissociation Agents

2007 · Takanori Akagi, Masae Suzuki, et al. · Japanese Journal of Applied Physics · 6

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Energy savings evaluation of enhanced classroom daylighting utilization

2024 · Yuniar Afifa Nur, Gyuyoung Yoon, et al. · Energy and Buildings · 4

Design and characterization of SAW filters for high power performance

2017 · Jim Costa, Sean McHugh, et al. · IEEE International Ultrasonics Symposium · 4