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Takafumi Okamoto
Institution:
Murata (Japan)
Observed institutions:
Pennsylvania State University,
Murata (Japan)
OpenAlex ID:
A5102095947
Electric field concentration in the vicinity of the interface between anode and degraded BaTiO3-based ceramics in multilayer ceramic capacitor
2011
·
Takafumi Okamoto
, Shuji Kitagawa
, et al.
·
Applied Physics Letters
·
58
Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum
2013
·
Keigo Suzuki
, Takafumi Okamoto
, et al.
·
Journal of Applied Physics
·
31
A charge-based deep level transient spectroscopy measurement system and characterization of a ZnO-based varistor and a Fe-doped SrTiO 3 dielectric
2016
·
Takafumi Okamoto
, Jeffrey Long
, et al.
·
Japanese Journal of Applied Physics
·
12
Effect of surface charges on the polarization of BaTiO 3 thin films investigated by UHV ‐ SPM
2018
·
Keigo Suzuki
, Tadasu Hosokura
, et al.
·
Journal of the American Ceramic Society
·
10
The Kelvin Probe Force Microscopy Measurement of Degraded Multilayer Ceramic Capacitors with Ni Inner Electrode
2011
·
Takafumi Okamoto
, Noriyuki Inoue
, et al.
·
Key engineering materials
·
6
Change in Electric Field Distribution in Non-Reducing BaTiO3 Based-Dielectric Layer Loaded at High Temperature
2013
·
Takafumi Okamoto
, Akira Ando
, et al.
·
Key engineering materials
·
3
Alkaline-Earth and Rare-Earth Elements and Oxygen Vacancy in BaTiO3: Analyses by First-Principles Calculations and EXAFS
2011
·
Atsushi Honda
, Shin'ichi Higai
, et al.
·
Key engineering materials
·
2
Erratum: “Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum” [J. Appl. Phys. 113, 064103 (2013)]
2023
·
Keigo Suzuki
, Takafumi Okamoto
, et al.
·
Journal of Applied Physics
PDF
Nanoscale characterization of ferroelectric materials by scanning probe microscope under ultrahigh vacuum
2014
·
Keigo Suzuki
, Takafumi Okamoto
, et al.
·
IEEE International Symposium on Applications of Ferroelectrics (ISAF)
Nanoscale characterization of ferroelectric materials by scanning probe microscope under ultrahigh vacuum
2014
·
Keigo Suzuki
, Takafumi Okamoto
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
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Works count:
10
Citation count:
122
H-index:
5
I10-index:
4
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