Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Fu-Jyuan Li
Institution:
National United University
Observed institution:
National United University
ORCID:
0009-0000-8377-3364
Observed ORCID:
0009-0000-8377-3364
OpenAlex ID:
A5102806692
Effect of Oxygen Treatment on the Electrical Performance and Reliability of IWO Thin-Film Transistors
2024
·
Yi-Xuan Chen
, Yi-Lin Wang
, et al.
·
IEEE Transactions on Nanotechnology
·
5
Effect of Electrical Performance and Reliability by Adjustment of the Sequence and Concentration of HfAlOx on IWO Thin-Film Transistors
2024
·
Yi-Xuan Chen
, Fu-Jyuan Li
, et al.
·
IEEE Transactions on Nanotechnology
·
2
High-Stability IWO Thin-Film Transistors Under Microwave Annealing for Low Thermal Budget Application
2024
·
Yi-Xuan Chen
, Yi-Lin Wang
, et al.
·
IEEE Transactions on Nanotechnology
·
1
Improving Reliability of IWO Thin Film Transistors with ZrAlOx via Varying AlOx/ZrOx Deposition Sequence in ALD
2024
·
Yi-Xuan Chen
, Fu-Jyuan Li
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Show more works
View as search
Works count:
4
Citation count:
8
H-index:
2
I10-index:
Year
Topic
Type
