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Chun-Yuan Chen

Improved Electrical Characteristics of Bulk FinFETs With SiGe Super-Lattice-Like Buried Channel
2019 · Yan-Lin Li, Kuei-Shu Chang-Liao, et al. · IEEE Electron Device Letters · 26
Shape-based grey-level image interpolation
1999 · Keh-Shih Chuang, Chun-Yuan Chen, et al. · Physics in Medicine and Biology · 19
Beam Hardening Correction for Computed Tomography Images Using a Postreconstruction Method and Equivalent Tisssue Concept
2001 · Chun-Yuan Chen, Keh-Shih Chuang, et al. · Journal of Imaging Informatics in Medicine · 16
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Analysis for the Robust $H_{\infty}$ Synchronization of Nonlinear Stochastic Coupling Networks Through Poisson Processes and Core Coupling Design
2015 · Shih-Ju Ho, Chun-Yuan Chen, et al. · IEEE Transactions on Control of Network Systems · 14
Predicting the risk category of thymoma with machine learning-based computed tomography radiomics signatures and their between-imaging phase differences
2024 · Zhu Liang, Jiamin Li, et al. · Scientific Reports · 12
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Improved Erasing Speed in Junctionless Flash Memory Device by ${\rm HfO}_{2}/{\rm Si}_{3}{\rm N}_{4}$ Stacked Trapping Layer
2013 · Chun-Yuan Chen, Kuei-Shu Chang-Liao, et al. · IEEE Electron Device Letters · 12
Vth adjustable self-aligned embedded source/drain Si/Ge nanowire FETs and dopant-free NVMs for 3D sequentially integrated circuit
2014 · Chih-Chao Yang, Jia-Min Shieh, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 11
Improved programming/erasing speed of charge-trapping flash device with tunneling layer formed by low temperature nitrogen-rich SiN/SiO2 stack
2012 · Chun-Yuan Chen, Kuei-Shu Chang-Liao, et al. · Solid-State Electronics · 9
Enhanced Operation Characteristics in Poly-Si Nanowire Charge-Trapping Flash Memory Device With SiGe Buried Channel
2014 · Chun-Yuan Chen, Kuei-Shu Chang-Liao, et al. · IEEE Electron Device Letters · 5
Enhanced Performance of Single Poly-Silicon EEPROM Cell With a Tungsten Finger Coupling Structure by Full CMOS Process
2014 · Chih-Ping Chung, Kuei-Shu Chang-Liao, et al. · IEEE Transactions on Electron Devices · 5
IR drop Prediction Based on Machine Learning and Pattern Reduction
2024 · Yong-Fong Chang, Yung-Chih Chen, et al. · ACM Great Lakes Symposium on VLSI (GLSVLSI) · 4
Half-Fringe Photoelastic Analysis Of Rectangular Plates Subjected To Transverse Loading
1988 · Wei-Chung Wang, Chun-Yuan Chen, et al. · Optical Engineering · 3
Improved programming and erasing speeds of poly-Si flash memory device by HfO2/Si3N4 bandgap-engineered trapping layer
2013 · Chun-Yuan Chen, Kuei-Shu Chang-Liao, et al. · Microelectronic Engineering · 2
Polygon interpolation for serial cross sections
2007 · Ya-Hui Shiao, Keh-Shih Chuang, et al. · Computers in Biology and Medicine · 2
Effects of HfO2/SiON/SiN stacked trapping layer on operation characteristics of poly-Si flash memory devices
2015 · Hsin-Kai Fang, Kuei-Shu Chang-Liao, et al. · Microelectronic Engineering · 1
Single-shot phase retrieval using automatic differentiation and bilateral total variation
2024 · Chunyuan Chen, Zexin Feng
A machine learning based on CT radiomics signature and change value features for predicting the risk classification of thymoma
2024 · Liang zhu, Jiaming Li, et al. · Research Square
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Minimized program disturb for vertically stacked junctionless charge-trapping flash memory devices by adopting in-situ doped poly-silicon channel
2015 · Hsin-Kai Fang, Kuei-Shu Chang-Liao, et al. · Microelectronic Engineering
Improved Operation Characteristics in Charge-Trapping Flash Memory Devices With Engineered Dielectric Stack, Sige and Junctionless Poly-Si Channels
2013 · Kuei-Shu Chang-Liao, Zong-Hao Ye, et al. · ECS Meeting Abstracts
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Improved characteristics of charge-trapping flash device with tunneling layer formed by low temperature nitrogen-rich SiN/SiO2 stack
2011 · Chun-Yuan Chen, Kuei-Shu Chang-Liao, et al. · International Semiconductor Device Research Symposium
Works count: 20
Citation count: 141
H-index: 8
I10-index: 7
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