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Niladri Bhattacharjee

Observed names: Bhattacharjee, Niladri, N. Bhattacharjee
ORCID: 0000-0003-2730-8307
Observed ORCID: 0000-0003-2730-8307
OpenAlex ID: A5102907857
Reconfigurable field effect transistors: A technology enablers perspective
2022 · T. Mikolajick, G. Galderisi, et al. · Solid-State Electronics · 108
Three-to-one analog signal modulation with a single back-bias-controlled reconfigurable transistor
2022 · Maik Simon, Halid Mulaosmanovic, et al. · Nature Communications · 62
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Machine Learning-Based Compact Model Design for Reconfigurable FETs
2024 · Maximilian Reuter, Johannes Wilm, et al. · IEEE Journal of the Electron Devices Society · 23
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Multiple-Independent-Gate Reconfigurable FETs Processed on Industrial 300 mm FDSOI
2025 · N. Bhattacharjee, Y. He, et al. · IEEE Electron Device Letters · 22
Dynamic Reconfigurable Security Cells Based on Emerging Devices Integrable in FDSOI Technology
2024 · Niladri Bhattacharjee, Viktor Havel, et al. · Design, Automation, and Test in Europe · 16
Back‐Bias Effects in a SiGe Nanosheet Transistor with Multiple Independent Gates
2024 · Christoph Beyer, Niladri Bhattacharjee, et al. · Advanced Materials Technologies · 12
Single Transistor Analog Building Blocks: Exploiting Back-Bias Reconfigurable Devices
2023 · Niladri Bhattacharjee, Maximilian Reuter, et al. · IEEE Interregional NEWCAS Conference (NEWCAS) · 12
Verilog-A Look-Up Table Model of a TIG-RFET Compatible with 22 nm FDSOI Design Rules Satisfying Gummel Symmetry
2025 · Juan P. Martinez, Niladri Bhattacharjee, et al. · International Conference on Modern Circuits and Systems Technologies · 7
Speeding-Up Emerging Device Development Cycles by Generating Models via Machine-Learning directly from Electrical Measurements
2024 · J. Trommer, M. Reuter, et al. · 7
Circuit Polymorphism Enabled by RFET Devices Processed on Industrial FDSOI
2025 · N. Bhattacharjee, G. Galderisi, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 6
Design Enablement Flow for Circuits with Inherent Obfuscation based on Reconfigurable Transistors
2023 · J. Trommer, N. Bhattacharjee, et al. · Design, Automation, and Test in Europe · 6
Ultra-Low Voltage Reconfigurable FETs in 22nm FDSOI Technology Enabling Dynamic Circuit Obfuscation for Embedded Security
2026 · Yuxuan He, Aniruddh Holemadlu, et al. · IEEE Journal of the Electron Devices Society · 4
Generating Predictive Models for Emerging Semiconductor Devices
2024 · Maximilian Reuter, Andreas Kramer, et al. · IEEE Journal of the Electron Devices Society · 4
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A Compendium of Logic Gates Based on Reconfigurable Three‐Independent‐Gate Transistors Realized in FDSOI Hardware
2026 · Juan P. Martinez, Yuxuan He, et al. · Advanced Electronic Materials · 2
A Low-Power 2-bit Full Adder realized with Three-Independent-Gate Reconfigurable FETs
2026 · Giulio Galderisi, Yuxuan He, et al. · IEEE International Symposium on Circuits and Systems proceedings · 1
Efficient In‐Hardware Matrix–Vector Multiplication and Addition Exploiting Bilinearity of Schottky Barrier Transistors Processed on Industrial FDSOI
2026 · Juan P. Martinez, Niladri Bhattacharjee, et al. · Advanced Electronic Materials · 1
Design and Evaluation of an RFET Standard Cell Library Compatible With 22-nm FDSOI
2025 · Nima Kavand, Armin Darjani, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1
Thermal noise of hot carriers under natural sunlight
2022 · Igor Konovalov, Niladri Bhattacharjee · Solar Energy · 1
Reliability Characterization of BOXFET Devices with Emphasis on Temperature Dependence
2026 · IEEE International Symposium on Reliability Physics 2026, Arfaoui, Wafa, et al. · Underline Science Inc.
Works count: 21
Citation count: 298
H-index: 7
I10-index: 7
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