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Aleksey V. Dolmatov
Observed name:
A. V. Dolmatov
Institution:
MIREA - Russian Technological University
Observed institutions:
Russian Academy of Sciences,
MIREA - Russian Technological University,
Institute of Theoretical and Applied Electrodynamics
ORCID:
0000-0003-2969-2971
Observed ORCID:
0000-0003-2969-2971
OpenAlex ID:
A5102947028
Diagnostics of structural integrity violations of avionics during impact tests
2024
·
S. U. Uvaysov
, A. V. Dolmatov
, et al.
·
Russian Technological Journal
·
2
PDF
Detection of defects in printed circuit boards by the acoustic emission method
2024
·
S. U. Uvaysov
, N. T. Luu
, et al.
·
Russian Technological Journal
·
2
PDF
Calculating permissible deviations of vibration accelerations of printed circuit assemblies by simulation modeling
2023
·
V. K. Bityukov
, A. V. Dolmatov
, et al.
·
Russian Technological Journal
·
2
PDF
Localization of structural defects of printed circuit board assembly by vibration diagnostics
2026
·
S. U. Uvaysov
, A. V. Dolmatov
, et al.
·
Russian Technological Journal
PDF
The Effect of the Silicon Shell of Magnetic Microparticles on the Viscoelastic Properties of Magnetoactive Silicone Elastomers and Their Response to an External Magnetic Field
2025
·
S. A. Kostrov
, A. V. Dolmatov
, et al.
·
Polymer Science Series A
Research on the Change of Resistance of CrNi Thin-Film Resistor During Accelerated Climate Testing
2024
·
Pham Xuan Hanh
, Aleksey V. Dolmatov
, et al.
·
International Seminar on Electron Devices Design and Production (SED)
The Study of the Impact of Structural Defects in Electronic Components on Their Mechanical Amplitude-Frequency Characteristics
2024
·
Vo The Hai
, Saygid U. Uvaysov
, et al.
·
International Seminar on Electron Devices Design and Production (SED)
Application of k-Nearest Neighbors Algorithm in Detection of Hidden Defects in Multilayer Printed Circuit Boards by Ultrasonic Method
2024
·
Saygid U. Uvaysov
, Aleksey V. Dolmatov
, et al.
·
International Siberian workshops and tutorials on electron devices and materials
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Works count:
8
Citation count:
6
H-index:
2
I10-index:
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