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Yi-Shu Lu

Observed names: Y. L. Lu, Yen-Lung Lu, Yu-Hao LU, Yuan-To Lu, yuyue Lu
Observed institutions: National Yang Ming Chiao Tung University, National Central University, Nanya Technology (Taiwan), National Center for High-Performance Computing, Industrial Technology Research Institute, Hubei University
ORCID: 0000-0002-9808-6652
Observed ORCID: 0000-0002-9808-6652
OpenAlex ID: A5103026211
SPENT: A Successive POI Recommendation Method Using Similarity-Based POI Embedding and Recurrent Neural Network with Temporal Influence
2019 · Mu-Fan Wang, Yi-Shu Lu, et al. · IEEE International Conference on Big Data and Smart Computing (BigComp) · 25
Successive POI Recommendation with Category Transition and Temporal Influence
2018 · I-Cheng Lin, Yi-Shu Lu, et al. · IEEE Annual International Computer Software and Applications Conference (COMPSAC) · 14
An Expected Win Rate-Based Real Time Bidding Strategy for Branding Campaign by the Model-Free Reinforcement Learning Model
2020 · Wen-Yueh Shih, Yi-Shu Lu, et al. · IEEE Access · 9
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Design of a Data Collection System with Data Compression for Small Manufacturers in Industrial IoT Environments
2019 · Chunju Tsai, Wen-Yueh Shih, et al. · Asia-Pacific Network Operations and Management Symposium (APNOMS) · 5
A Grid-Based successive point-of-interest recommendation method
2017 · Hung-Yi Gau, Yi-Shu Lu, et al. · International Conference on Ubi-Media Computing and Workshops (Ubi-Media) · 5
Automated Information Mining on Multimedia TV News Archives
2005 · P. S. Lai, S. S. Cheng, et al. · Lecture notes in computer science · 3
Rural E-Commerce and Brand Building: Evidence from National Rural E-Commerce Comprehensive Demonstration Policy in China
2025 · Shixiong Cheng, yuyue Lu, et al. · SSRN Electronic Journal · 2
SPENT+: A Category- and Region-aware Successive POI Recommendation Model
2021 · Hsu-Chao Lai, Yi-Shu Lu, et al. · Asia-Pacific Network Operations and Management Symposium (APNOMS) · 1
Accurate process window determination for EUV lithography using large field of view eBeam metrology and stochastic-aware modeling
2025 · Su-Te Ma, Chih-Ping Chang, et al. · Metrology, Inspection, and Process Control XXXVI
Comparative analysis of EUV mask writers: VSB vs. MB technologies
2025 · Kuan Chen Chen, Chun-Cheng Liao, et al. · SPIE Optical and EUV Nanolithography
Quantum Metrology of Fluxonium Superconducting Qubits for Scalable Quantum Information Processing
2025 · Yuan-To Lu, Wei-Chen Lin, et al. · Conference on Lasers and Electro-Optics
Analysis of Students' Action Decisions about SDGs Issues in Open Inquiry Activity with Real Open Data
2023 · Yu-Hao LU, Chia-Chun TSENG, et al. · International Conference on Computers in Education
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A skeleton and gesture based user authentication system
2015 · Hsueh-Fan Lee, Yi-Shu Lu, et al. · International Conference on Ubi-Media Computing (UMEDIA)
Works count: 13
Citation count: 64
H-index: 5
I10-index: 2
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