Author

Lei Tong

Observed names: Tong lei, Tong, Lei

Institution: Anhui University

Observed institutions: Anhui University, University of Electronic Science and Technology of China, State Key Laboratory of Electronic Thin Films and Integrated Devices

ORCID: 0000-0001-7416-8322

Observed ORCID: 0000-0001-7416-8322

OpenAlex ID: A5103129843

Normal and abnormal dielectric relaxation behavior in KTaO 3 ceramics

2017 · Lei Tong, Jie Sun, et al. · RSC Advances · 35

High-temperature colossal dielectric behavior of BaZrO 3 ceramics

2017 · Lei Tong, Haibo Li, et al. · RSC Advances · 15

Superior dielectric properties in Na0.35%Ba99.65%Ti99.65%Nb0.35%O3/PVDF composites

2017 · Shuting Wang, Jie Sun, et al. · Materials Letters · 11

Microwave dielectric properties of the low-temperature-fired Li2ZnTi3O8–Li2TiO3 ceramics for LTCC applications

2018 · Tong lei, Jiawang Chen, et al. · Journal of Materials Science Materials in Electronics · 5

2D transport and weak antilocalization effect in topological semimetal PtBi2 nanoflakes

2025 · Ankang Zhu, Cheng Wang, et al. · AIP Advances · 1

Works count: 6

Citation count: 67

H-index: 4

I10-index: 3