Author

Hao Yang

Observed names: H. Yang, Hao YANG, Yang, Hao

Institution: Chongqing Technology and Business University

Observed institutions: Chongqing Technology and Business University, Inner Mongolia University, Shantou University, Max Planck Institute for Intelligent Systems

ORCID: 0000-0003-4026-2235

Observed ORCID: 0000-0003-4026-2235

OpenAlex ID: A5103186562

Metro System Inundation in Zhengzhou, Henan Province, China

2022 · Hao Yang, Linshuang Zhao, et al. · Sustainability · 56

PDF

Preferential sputtering in quantitative sputter depth profiling of multi-element thin films

2021 · Songyou Lian, H. Yang, et al. · Thin Solid Films · 22

Quantification of glow discharge optical emission spectrometry depth profiles of coated-Ni/Fe foil

2023 · Yuqi Geng, Sai Ma, et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 8

Enhanced corrosion protection of superhydrophobic SiO2/epoxy composite coatings for aluminum alloys with 8-HQ incorporated MSNs containers

2025 · Chen-Xiang Wang, Hao Yang, et al. · Journal of the Taiwan Institute of Chemical Engineers · 6

Quantification of High Resolution Pulsed RF GDOES Depth Profiles for Mo/B4C/Si Nano-Multilayers

2021 · Hao Yang, Songyou Lian, et al. · Coatings · 6

PDF

Dynamic character of compositional sputter depth profiling by SIMS: A comparison of different models for quantitative profile evaluation

2023 · Siegfried Hofmann, Feng-Min Zhong, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 5

PDF

Optimization of the two parameters in the deconvolution procedure for obtaining the original in-depth distribution of composition from measured sputter depth profile by genetic algorithm

2020 · C.L. Wang, J. Li, et al. · Vacuum · 5

Raman spectroscopy in determination of forsythin content

2011 · Wei WANG, Xin-xin XI, et al. · Academic Journal of Second Military Medical University · 4

Quantification of Ag/Ni Auger electron spectroscopy depth profiles upon preferential sputtering with non-stationary roughness

2022 · Songyou Lian, H. Yang, et al. · Thin Solid Films · 3

Artifacts in multilayer depth profiling: Origin and quantification of a double peak layer profile of Ag in ToF-SIMS depth profiles of an Ag/Ni multilayer

2020 · S. Hofmann, H. Yang, et al. · Materials Characterization · 3

Multi-objective optimization of pseudoplastic fluid mixing in an eccentric fractal impeller stirred tank based on BO-RFR model and NSGA-II algorithm

2026 · Deyin Gu, Hao Yang, et al. · Journal of the Taiwan Institute of Chemical Engineers

Oste Pillar Forest Fabricated by Double Replica Moldings of Laser-cut Pmma Mold

2021 · Yang, Yuqian, Xiao, Zhiqing, et al. · Zenodo (CERN European Organization for Nuclear Research)

Explanation of the apparent depth resolution improvement by SIMS using cluster ion detection

2020 · Siegfried Hofmann, Pavel Lejcek, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

Partial Wave Analysis of Resonances Amplitude Based on Monte Carlo Methods

2017 · Hao Yang, Lingfang Yin, et al. · IJEIR

Works count: 14

Citation count: 118

H-index: 5

I10-index: 2