Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Donghwan Seo
Observed name:
D.S. Seo
Institution:
Soongsil University
Observed institutions:
Soongsil University,
Korea Advanced Institute of Science and Technology,
Samsung (South Korea),
Agency for Defense Development,
Samsung Electronics (South Korea)
ORCID:
0000-0002-4049-5509
Observed ORCID:
0000-0002-4049-5509
OpenAlex ID:
A5103233685
Asymmetric SOI CMOS Switch With Series and Parallel Resonators to Enhance Isolation
2023
·
Jaehyun Kwon
, Jaeyong Lee
, et al.
·
IEEE Transactions on Circuits & Systems II Express Briefs
·
18
Quantification of Performance Variation and Crack Evolution of Bond-Wire Interconnects Under Harsh Temperature Environments by S-Parameter Analysis
2021
·
Tae Yeob Kang
, Donghwan Seo
, et al.
·
IEEE Transactions on Components Packaging and Manufacturing Technology
·
14
The effect of temperature on performance of a RF CMOS power amplifer and bond wires
2015
·
Tae Yeob Kang
, Donghwan Seo
·
IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
·
6
Study of the Inter-stage Capacitor Effects of a Rf Cmos Power Amplifier to Enhance Its Efficiency
2013
·
Hoyong Hwang
, Donghwan Seo
, et al.
·
Progress In Electromagnetics Research C
·
6
Power detection method using a virtual ground node for RF CMOS power amplifier applications
2012
·
Donghwan Seo
, Changhyun Lee
, et al.
·
Journal of Electromagnetic Waves and Applications
·
6
Investigation of the power transistor size related to the efficiency of switching‐mode RF CMOS power amplifier
2013
·
Hoyong Hwang
, Donghwan Seo
, et al.
·
Microwave and Optical Technology Letters
·
5
Numerical Analysis of the Supply Voltage of a Switching Mode RF CMOS Power Amplifier to Enhance Its Efficiency
2013
·
Hoyong Hwang
, Donghwan Seo
, et al.
·
Microwave and Optical Technology Letters
·
4
The effect of temperature on performance of a RF CMOS power amplifer and bond wires
2016
·
Tae Yeob Kang
, Donghwan Seo
·
IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS)
·
3
Split driver stages for a switching mode power amplifier with multipairs of power stages
2014
·
Donghwan Seo
, Changkun Park
·
Microwave and Optical Technology Letters
·
3
2.4-GHz CMOS Power Amplifier With Common-Mode Self-Rejection Technique to Suppress Even Harmonics
2025
·
Donghwan Seo
, Jaeyong Lee
, et al.
·
IEEE Access
·
2
Early detection and instantaneous cause analysis of defects in interconnects by machine learning (ranking-CNN) of scattering parameter patterns
2019
·
Tae Yeob Kang
, Donghwan Seo
, et al.
·
IMAPSource Proceedings
·
2
A Ku-Band CMOS Power Amplifier with Common-Mode Suppression Using Inter-Stage Transformer
2025
·
Donghwan Seo
, Jaeyong Lee
, et al.
·
European Microwave Integrated Circuits Conference
·
1
A Compact PA-LNA Bi-Directional Amplifier Using Transistor Switch Achieving High Integration in 40-nm LP CMOS
2025
·
Hyunsoo Kim
, Jaeyong Lee
, et al.
·
International Conference on Electronics, Circuits and Information Engineering (ECIE)
·
1
CMOS Power Amplifier with Inter-Stage Matching Network Using Tournament-Shape Transformer
2023
·
Donghwan Seo
, Jaeyong Lee
, et al.
·
Asia-Pacific Microwave Conference (APMC)
·
1
A Method of Reliability Demonstration Test Design For Missiles Stored in an Ammunition Igloo Without Maintenance
2019
·
Donghwan Seo
, Tae Yeob Kang
, et al.
·
Journal of Applied Reliability
·
1
1.9-GHz CMOS power amplifier using a current source to enhance its dynamic range
2014
·
Donghwan Seo
, Sung-Hun Lim
, et al.
·
Microwave and Optical Technology Letters
·
1
A 2.05 um/sup 2/ full CMOS ultra-low power SRAM cell with 0.15 nm generation single gate CMOS technology
2002
·
J.H. Jang
, H.S. Kim
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
1
Circuit-Level Reliability Analysis of CMOS Power Amplifiers: Impact of Harmonic-Induced Voltage Stress
2026
·
Donghwan Seo
, Jaeyong Lee
, et al.
·
IEEE Transactions on Microwave Theory and Techniques
On-chip canary circuit design for electronic interconnects by utilizing RF resonance peak movement as a prognostic factor
2023
·
Tae Yeob Kang
, Donghwan Seo
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Design Guideline for Non-Accelerated Life Testing on Components of Defense Systems by Modifying MIL-STD-810 Testing Profiles
2021
·
Tae Yeob Kang
, Donghwan Seo
, et al.
·
Journal of Applied Reliability
Analysis of the Gate Bias Effects of the Cascode Structure for Class-E CMOS Power Amplifier
2017
·
Donghwan Seo
·
The Journal of Korean Institute of Electromagnetic Engineering and Science
Show more works
View as search
Works count:
21
Citation count:
75
H-index:
5
I10-index:
2
Year
Topic
Type
