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B. R. Singh
Observed names:
B R Singh,
B. R Singh,
B. R. SINGH,
B.R Singh,
B.R. Singh
Institution:
Central Electronics Engineering Research Institute
Observed institutions:
Central Electronics Engineering Research Institute,
RWTH Aachen University,
Banaras Hindu University,
Indian Institute of Technology Kanpur
ORCID:
0009-0008-1384-441X
Observed ORCID:
0009-0008-1384-441X
OpenAlex ID:
A5103247676
Oxidation of Silicon in the Presence of Chlorine and Chlorine Compounds
1978
·
B. R. Singh
, P. Balk
·
Journal of The Electrochemical Society
·
54
PDF
Thermal Oxidation of Silicon in O 2 ‐ Trichloroethylene
1979
·
B. R. Singh
, P. Balk
·
Journal of The Electrochemical Society
·
14
PDF
Direct Laser Beam Writing on YBaCuO Film for Superconducting Microelectronic Devices
1988
·
H. C. Pandey
, Y. K. Jain
, et al.
·
Japanese Journal of Applied Physics
·
10
PDF
Chlorine incorporation and electrical properties at silicon surfaces oxidized in trichloroethylene-oxygen
1979
·
H. Frenzel
, B.R. Singh
, et al.
·
Thin Solid Films
·
10
Transport of sodium ions in silicon dioxide films using MOS structure
1972
·
B. R. Singh
, S. S. Rai
, et al.
·
physica status solidi (a)
·
9
A study of the polarization phenomenon in lead silicate glass using the MGOS structure
1974
·
B R Singh
·
Journal of Physics D Applied Physics
·
6
PDF
Effect of temperature on M-O-S capacitances†
1972
·
B. R. SINGH
, R. S. SRIVASTAVA
·
International Journal of Electronics
·
6
Interface properties of low-temperature-grown anodic oxide on n-GaAs
1982
·
B. R. SINGH
, O. P. DAGA
, et al.
·
International Journal of Electronics
·
5
Air bridge and via hole technology for GaAs based microwave devices
1988
·
J.K. Singh
, O.P. Daga
, et al.
·
Microelectronics Journal
·
4
Some studies on the instability in MOS devices due to water vapour contamination
1976
·
B. R. SINGH
, B. D. TYAGI
, et al.
·
International Journal of Electronics
·
4
On the role of protons in thermally grown silicon dioxide films
1973
·
B. R. Singh
, B. D. Tyagi
, et al.
·
physica status solidi (a)
·
4
Effect of oxygen plasma on the electrical characteristics of GaAs MESFETs
2000
·
Vipan Kumar
, Aji Baby
, et al.
·
Solid-State Electronics
·
3
Instability phenomena in thin insulating films on silicon
1976
·
B.R. Singh
, Keshaw Singh
·
Microelectronics Reliability
·
2
Charge build-up in mos system under ionizing radiation
1980
·
Swaraj Srivastava
, G.P Srivastava
, et al.
·
Microelectronics Reliability
·
1
ChemInform Abstract: OXIDATION OF SILICON IN THE PRESENCE OF CHLORINE AND CHLORINE COMPOUNDS
1978
·
B. R. SINGH
, P. BALK
·
ChemInform
·
1
Effect of radiations on M-O-S devices†
1973
·
B. R. SINGH
, R. S. SRIVASTAVA
·
International Journal of Electronics
·
1
On the measurement of microwave absorption of bulk YBaCuO superconductors in X-band (8–12 GHz)
1991
·
J K Singh
, H S Kothari
, et al.
·
Bulletin of Materials Science
Direct Laser Beam Writing on YBaCuO Film for Superconducting Microelectronic Devices : Electrical Properties Condensed Matter
1988
·
Himanshu Pandey
, Yogendra Kumar Jain
, et al.
·
Japanese Journal of Applied Physics
The role of surface treatment on the anodic oxidation of n-GaAs
1984
·
Madhu Kochhar
, O.P. Daga
, et al.
·
Microelectronics Reliability
Study of Polarization Phenomenon in Phosphosilicate Glass Using M-G-O-S Structure
1973
·
B. R. Singh
, R. S. Srivastava
·
IETE Journal of Research
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Works count:
20
Citation count:
134
H-index:
6
I10-index:
4
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