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Huihong Luo
Observed name:
H. Luo
Institution:
Stanford University
Observed institution:
Stanford University
ORCID:
0000-0002-9816-1405
Observed ORCID:
0000-0002-9816-1405
OpenAlex ID:
A5103248825
D–Si(111)(1×1) surface for the study of silicon etching in aqueous solutions
1998
·
Huihong Luo
, Christopher E. D. Chidsey
·
Applied Physics Letters
·
37
Measuring Interfacial Fracture Toughness With The Blister Test
1996
·
R. J. Hohlfelder
, H. Luo
, et al.
·
MRS Proceedings
·
37
Blister Test Analysis Methods
1994
·
Robert J Hohlfelder
, Joost J. Vlassak
, et al.
·
MRS Proceedings
·
19
Infrared Spectroscopy of Covalently Bonded Species on Silicon Surfaces: Deuterium, Chlorine, and Cobalt Tetracarbonyl
1997
·
Huihong Luo
, Christopher E. D. Chidsey
, et al.
·
MRS Proceedings
·
12
STM Studies of Electrode/Electrolyte Interfaces and Silicon Surface Reactions in Controlled Atmospheres
1996
·
Christopher P. Wade
, Huihong Luo
, et al.
·
MRS Proceedings
·
3
An Analysis of Infrared Spectroscopic Geometries
1997
·
Gregory T. Merklin
, Huihong Luo
, et al.
·
MRS Proceedings
·
1
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Works count:
7
Citation count:
109
H-index:
4
I10-index:
4
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