Author

Chun-Hung Sun

Institution: Advanced Semiconductor Engineering (Taiwan)

Observed institution: Advanced Semiconductor Engineering (Taiwan)

OpenAlex ID: A5104278307

OCR is All you need: Importing Multi-Modality into Image-based Defect Classification System

2024 · Chih-Chung Hsu, Chia-Ming Lee, et al. · IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) · 2

Works count: 1

Citation count: 2

H-index: 1

I10-index: