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Jiongzhe Su
Institutions:
Southeast University,
Southeast University
Observed institutions:
Southeast University,
Southeast University
ORCID:
0009-0005-4310-9246
Observed ORCID:
0009-0005-4310-9246
OpenAlex ID:
A5105266843
Modeling of Endurance Degradation and Hard Breakdown for MRAM-OTP Demonstration
2025
·
Jiongzhe Su
, Quanhai Zhu
, et al.
·
IEEE Electron Device Letters
·
13
A 40nm 4Mb High-Reliability STT-MRAM Achieving 18ns Write-Time and 94.9% Wafer-Level-Die-Yield Across -55°C-to-125°C
2025
·
Yaoru Hou
, Haoran Du
, et al.
·
Custom Integrated Circuits Conference
·
6
A Versatile One-Time-Programmable STT-MRAM for Security-Aware Scenario
2025
·
Jiongzhe Su
, Haoran Du
, et al.
·
IEEE Transactions on Reliability
·
3
MTJ Based NV-SRAM Macro with Enhanced Read Margin and Low Static Power in FDSOI Process
2024
·
Jiongzhe Su
, Hao Cai
·
IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers)
·
2
Temperature-Adaptive MRAM Sensing Using Varied Magneto-Resistance
2023
·
Jiongzhe Su
, Hao Zhang
, et al.
·
IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)
·
2
Unveiling Security MRAM-OTP Macro using MTJ Hard Breakdown Mechanism
2024
·
Jiongzhe Su
, Haoran Du
, et al.
·
Asian Hardware Oriented Security and Trust Symposium (AsianHOST)
·
1
LLMVA: LLMs Empowered Verilog-A Iterative for MRAM Design Technology Co-Optimization
2026
·
Jiongzhe Su
, Quanhai Zhu
, et al.
·
ACM/IEEE Design Automation Conference (DAC)
Modeling and Analysis of Built-in Self-Repair for OTP-MRAM
2026
·
Cheng He
, Jiongzhe Su
, et al.
·
IEEE International Conference on Nanotechnology (IEEE-NANO)
A Novel Flash-SAR Hybrid ADC with Adjustable Resolution for STT-MRAM Analog In-Memory Computing
2026
·
Xiangyi Meng
, Mingtao Chen
, et al.
·
IEEE International Conference on Nanotechnology (IEEE-NANO)
A Hafnia-Based Fusion FeRAM with Integrated 1T1C and 1TnC Architecture for High-Speed in-Array KV Cache Transfer in Edge LLM Inference
2026
·
Yichen Zhu
, Yutao Shen
, et al.
·
IEEE Silicon Nanoelectronics Workshop
Endurance Optimization of Reference and Data FeRAM Bitcells by Wear Leveling and Pattern-Adaptive Recovery
2026
·
Yutao Shen
, Yichen Zhu
, et al.
·
IEEE Silicon Nanoelectronics Workshop
A Highly-Scalable and Full-Connected SOT P-Bit Ising Annealer for Combinatorial Optimization
2026
·
Huanghui Wang
, Haoran Du
, et al.
·
IEEE International Symposium on Circuits and Systems proceedings
Non-volatile Spintronic Flip-Flops with Checkpoint Preservation Supported in RISC-V Platform
2026
·
Jiongzhe Su
, Mingtao Chen
, et al.
·
Design, Automation, and Test in Europe
A 28-nm Density-Capable 6ns Access Time MRAM Macro using Multi-bit Sense Amplifier and Dual-mode ECC
2026
·
Jiongzhe Su
, Haoran Du
, et al.
·
Custom Integrated Circuits Conference
A FinFET Integrated STT-MRAM with Triple Balanced Access Strategy
2023
·
Xinshu Xie
, Jiongzhe Su
, et al.
·
IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)
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Works count:
15
Citation count:
27
H-index:
3
I10-index:
1
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