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Kyoji Mizoguchi

Data-Retention Characteristics Comparison of 2D and 3D TLC NAND Flash Memories
2017 · Kyoji Mizoguchi, Tomonori Takahashi, et al. · IEEE International Memory Workshop (IMW) · 73
1.22μm 35.6Mpixel RGB Hybrid Event-Based Vision Sensor with 4.88μm-Pitch Event Pixels and up to 10K Event Frame Rate by Adaptive Control on Event Sparsity
2023 · Kazutoshi Kodama, Yusuke Sato, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 55
A 2.97μm-Pitch Event-Based Vision Sensor with Shared Pixel Front-End Circuitry and Low-Noise Intensity Readout Mode
2023 · Atsumi Niwa, Futa Mochizuki, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 40
Lateral charge migration suppression of 3D-NAND flash by vth nearing for near data computing
2017 · Kyoji Mizoguchi, Shohei Kotaki, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 33
Automatic Data Repair Overwrite Pulse for 3D-TLC NAND Flash Memories with 38x Data-Retention Lifetime Extension
2019 · Kyoji Mizoguchi, Kyosuke Maeda, et al. · IEEE International Reliability Physics Symposium proceedings · 10
RTN impact on data-retention failure/recovery in scaled (∼1Ynm) TLC NAND flash memories
2017 · Seiichi Aritome, Tomonori Takahashi, et al. · IEEE International Reliability Physics Symposium proceedings · 6
Error elimination ECC by horizontal error detection and vertical-LDPC ECC to increase data-retention time by 230% and acceptable bit-error rate by 90% for 3D-NAND flash SSDs
2018 · Shun Suzuki, Yoshiaki Deguchi, et al. · IEEE International Reliability Physics Symposium proceedings · 3
Privacy-Aware Data-Lifetime Control NAND Flash System for Right to be Forgotten with In-3D Vertical Cell Processing
2019 · Shun Suzuki, Kyoji Mizoguchi, et al. · IEEE Asian Solid-State Circuits Conference (A-SSCC) · 2
Less Reliable Page Error Reduction for 3D-TLC NAND Flash Memories with Data Overhead Reduction by 40% and Data-retention Time Increase by 5.0x
2019 · Kyosuke Maeda, Kyoji Mizoguchi, et al. · Silicon Nanoelectronics Workshop (SNW) · 1
38xデータ保持寿命延長による3D-TLC NANDフラッシュメモリのための自動データ修復オーバライト・パルス【JST・京大機械翻訳】
2019 · Kyoji Mizoguchi, Maeda Kyosuke, et al. · IEEE Conference Proceedings
Data-Retention Lifetime evaluation of TLC NAND Flash Memories
2018 · Kyoji Mizoguchi, Tomonori Takahashi, et al. · The Japan Society of Applied Physics
RTN Impact on Data-Retention Failure/Recovery Mechanism in Sub-20nm NAND Flash Memories
2018 · Kyoji Mizoguchi, Tomonori Takahashi, et al. · The Japan Society of Applied Physics
High Reliability Techniques of 3D-NAND Flash Memories by Lateral Charge Migration Suppression
2018 · Kyoji Mizoguchi, Shohei Kotaki, et al. · The Japan Society of Applied Physics
Error Analysis of NAND Flash Memories for Long-Term Storage
2016 · Kyoji Mizoguchi, Tomonori Takahashi, et al. · IEICE Technical Report; IEICE Tech. Rep.
Works count: 14
Citation count: 223
H-index: 6
I10-index: 5
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