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Author

Xing Tang

Observed names: Tang, X. (Xing), Tang, Xiaohui, Tang, Xing
Observed institution: Beijing Institute of Technology
ORCID: 0009-0002-2601-6863
Observed ORCID: 0009-0002-2601-6863
OpenAlex ID: A5105889141
Topologically protected entanglement switching around exceptional points
2024 · Zan Tang, Tian Chen, et al. · Light Science & Applications · 22
Controlling transfer and chirality of topological quantum state through dissipation in quantum walk
2025 · Xing Tang, Tian Chen, et al. · Physical Review Research · 4
Electron microscopy of silicides formation in Schottky barrier contacts to electronic devices
2008 · Katcki, J., Ratajczak, J., et al. · HAL (Le Centre pour la Communication Scientifique Directe)
Investigation of the ytterbium silicide as low Schottky barrier source/drain contact material for n-type MOSFET
2008 · Yarekha, Dmitri, Larrieu, G., et al. · HAL (Le Centre pour la Communication Scientifique Directe)
Room temperature single-electron operation and fabrication of downscaled self-aligned single-dot memory devices
2006 · Tang, Xing, Reckinger, N., et al. · HAL (Le Centre pour la Communication Scientifique Directe)
Transmission electron microscopy study of erbium silicide formation using a Pt/Er stack on a thin silicon-on-insulator substrate
2005 · Łaszcz, A., Katcki, J., et al. · HAL (Le Centre pour la Communication Scientifique Directe)
Simulation et optimisation d'une mémoire flash nanométrique
2004 · Krzeminski, C., Dubois, Emmanuel, et al. · HAL (Le Centre pour la Communication Scientifique Directe)
Works count: 8
Citation count: 26
H-index: 2
I10-index: 1
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