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Hyuk-Min Kwon

Sampling is Matter: Point-Guided 3D Human Mesh Reconstruction
2023 · Jeonghwan Kim, Mi-Gyeong Gwon, et al. · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · 62
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Zinc oxide and indium-gallium-zinc-oxide bi-layer synaptic device with highly linear long-term potentiation and depression characteristics
2022 · Hyun-Woong Choi, Ki-Woo Song, et al. · Scientific Reports · 53
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Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High-$k$ Dielectric/Metal Gate
2011 · Hyuk-Min Kwon, In-Shik Han, et al. · IEEE Electron Device Letters · 30
Characterization of Al2O3–HfO2–Al2O3 sandwiched MIM capacitor under DC and AC stresses
2012 · Ho-Young Kwak, Hyuk-Min Kwon, et al. · Solid-State Electronics · 28
Highly Thin Film with Aerosol-Deposited Perovskite Quantum Dot/Metal Oxide Composite for Perfect Color Conversion and Luminance Enhancement
2021 · Sunghoon Kim, Seokwoo Kang, et al. · Chemical Engineering Journal · 26
Explicit Thermal Resistance Model of Self-Heating Effects of AlGaN/GaN HEMTs with Linear and Non-Linear Thermal Conductivity
2022 · Surajit Chakraborty, Walid Amir, et al. · Materials · 25
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Tailoring the Size and Shape of ZnO Nanoparticles for Enhanced Performance of OLED Device
2023 · Nikita Khairnar, Hyukmin Kwon, et al. · Nanomaterials · 24
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Analysis of reliability characteristics of high capacitance density MIM capacitors with SiO2–HfO2–SiO2 dielectrics
2010 · Sang-Uk Park, Chang-Yong Kang, et al. · Microelectronic Engineering · 20
Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs
2018 · Sung-Kyu Kwon, Hyuk-Min Kwon, et al. · IEEE Journal of the Electron Devices Society · 19
Impact of H2 High-Pressure Annealing Onto InGaAs Quantum-Well Metal–Oxide–Semiconductor Field-Effect Transistors With Al2O3/HfO2 Gate-Stack
2015 · Tae-Woo Kim, Hyuk-Min Kwon, et al. · IEEE Electron Device Letters · 19
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Three-color white electroluminescence emission using perovskite quantum dots and organic emitters
2022 · Hyukmin Kwon, Sangshin Park, et al. · Applied Surface Science · 17
Decrease of Dark Current by Reducing Transfer Transistor Induced Partition Noise With Localized Channel Implantation
2010 · Seong-Hyung Park, Jung- Bok, et al. · IEEE Electron Device Letters · 17
Effects of High-Pressure Annealing on Random Telegraph Signal Noise Characteristic of Source Follower Block in CMOS Image Sensor
2013 · Hyuk-Min Kwon, In-Shik Han, et al. · IEEE Electron Device Letters · 14
Novel blue multiresonance thermally activated delayed fluorescence host materials, including Ge-based bulky groups
2024 · Sangwook Park, Hyukmin Kwon, et al. · Journal of Materials Chemistry C · 13
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Effect of Nitrogen Concentration on Low-Frequency Noise and Negative Bias Temperature Instability of p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors with Nitrided Gate Oxide
2011 · In-Shik Han, Hyuk-Min Kwon, et al. · Japanese Journal of Applied Physics · 13
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Carrier transport mechanism in La-incorporated high-k dielectric/metal gate stack MOSFETs
2010 · Hyuk-Min Kwon, Won-Ho Choi, et al. · Microelectronic Engineering · 12
Thermal Immune NiGermanide for High Performance Ge MOSFETs on Ge-on- Si Substrate Utilizing $ \hbox{Ni}_{0.95}\hbox{Pd}_{0.05}$ Alloy
2009 · Ying-Ying Zhang, Jungwoo Oh, et al. · IEEE Transactions on Electron Devices · 12
Facial image deblurring network for robust illuminance adaptation and key structure restoration
2024 · Yongrok Kim, Hyukmin Kwon, et al. · Engineering Applications of Artificial Intelligence · 10
Synthesis and Electroluminescence Properties of New Blue Emitting Polymer Based on Dual-Core Type for Solution Process OLEDs
2022 · Seokwoo Kang, Hyukmin Kwon, et al. · Macromolecular Research · 9
A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications
2012 · Yi-Jung Jung, Byoung-Seok Park, et al. · IEEE Transactions on Semiconductor Manufacturing · 9
Dependence of Hot Carrier Reliability and Low Frequency Noise on Channel Stress in Nanoscale n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors
2011 · Hyuk-Min Kwon, Jung-Deuk Bok, et al. · Japanese Journal of Applied Physics · 9
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High efficiency and long device lifetime of organic light-emitting diodes using new electron-transporting materials with spirobifluorene groups
2025 · Changjun Lee, Sangwook Park, et al. · Dyes and Pigments · 8
2-anilino-1,4-naphthoquinone and 2-benzylamino-1,4-naphthoquinone with activated carbon composite electrodes for supercapacitor application
2024 · Chris Yeajoon Bon, Sharon Mugobera, et al. · Colloids and Surfaces A Physicochemical and Engineering Aspects · 8
New Methodology for Parasitic Resistance Extraction and Capacitance Correction in RF AlGaN/GaN High Electron Mobility Transistors
2023 · Surajit Chakraborty, Walid Amir, et al. · Electronics · 8
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Novel Yellow Azo Pyridone Derivatives with Different Halide Atoms for Image-Sensor Color Filters
2022 · Sunwoo Park, Yuna Kang, et al. · Molecules · 8
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Works count: 137
Citation count: 706
H-index: 13
I10-index: 18
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