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Robert M. Alabedra
Observed names:
Alabedra, R.,
Alabédra, R.,
R Alabedra,
R. ALABEDRA,
R. Alabedra,
R. Alabédra,
ROBERT ALABEDRA,
Robert ALABEDRA,
Robert Alabedra
show all 9
Observed institutions:
Centre National de la Recherche Scientifique,
Université Oran 1 Ahmed Ben Bella,
University of Technology - Iraq,
Université de Montpellier,
École Nationale Polytechnique d'Oran,
Institut d'Électronique et des Systèmes,
Université Montpellier 2
show all 7
OpenAlex ID:
A5107074187
1/f noise as a reliability estimation for solar cells
1983
·
L.K.J. Vandamme
, R. Alabedra
, et al.
·
Solid-State Electronics
·
52
Ionization energies in CdxHg1-xTe avalanche photodiodes
1993
·
G Leveque
, M Nasser
, et al.
·
Semiconductor Science and Technology
·
40
Low-frequency FM-noise-induced lineshape: a theoretical and experimental approach
2005
·
J.-P. Tourrenc
, P. Signoret
, et al.
·
IEEE Journal of Quantum Electronics
·
33
An Hg0.3Cd0.7Te avalanche photodiode for optical-fiber transmission systems at λ = 1.3 µm
1985
·
R. Alabedra
, B. Orsal
, et al.
·
IEEE Transactions on Electron Devices
·
27
Correlation between electrical and optical photocurrent noises in semiconductor laser diodes
1994
·
B. Orsal
, P. Signoret
, et al.
·
IEEE Transactions on Electron Devices
·
26
Gate current 1/f noise in GaAs MESFET's
1988
·
L.K.J. Vandamme
, D. Rigaud
, et al.
·
IEEE Transactions on Electron Devices
·
24
Hg/sub 0.4/Cd/sub 0.6/Te 1.55- mu m avalanche photodiode noise analysis in the vicinity of resonant impact ionization connected with the spin-orbit split-off band
1988
·
B. Orsal
, R. Alabedra
, et al.
·
IEEE Transactions on Electron Devices
·
21
Improved photoluminescence from electrochemically passivated GaSb
1997
·
A Salesse
, R Alabedra
, et al.
·
Semiconductor Science and Technology
·
19
Impact ionization resonance and auger recombination in Hg1 - xCdxTe ( 0.6 ≤ x ≤ 0.7 )
1987
·
G. Lecoy
, B. Orsal
, et al.
·
IEEE Journal of Quantum Electronics
·
15
Hg/sub 0.56/ Cd/sub 0.44/ Te 1.6- to 2.5- mu m avalanche photodiode and noise study far from resonant impact ionization
1991
·
B. Orsal
, R. Alabedra
, et al.
·
IEEE Transactions on Electron Devices
·
14
Low-Frequency Noise Measurements as an Investigation Tool of Pixel Flickering in Cooled Hg $_0.7 hbox Cd_0.3$ Te Focal Plane Arrays
2005
·
J.-P. Perez
, M. Myara
, et al.
·
IEEE Transactions on Electron Devices
·
8
Impact ionization rates for electrons and holes in Hg0.3Cd0.7Te in avalanche photodiodes for optical fiber transmission systems at λ = 1.3 μm
1985
·
B. Orsal
, R. Alabedra
, et al.
·
Journal of Crystal Growth
·
7
Low noise “ohmic” contacts on n-type silicon
1977
·
M. Rolland
, J.P. Nougier
, et al.
·
Solid-State Electronics
·
7
Noise in Photodiodes and Photoreceiver Systems
2009
·
Robert Alabedra
, Dominique Rigaud
·
6
Si-implanted n+-InP/p-InP junctions: Electrical characterization and noise
1986
·
A. L. Conjeaud
, B. Orsal
, et al.
·
Journal of Applied Physics
·
6
Caractérisation en bruit des photodiodes P.I.N. Hg1-x Cdx Te à λ = 1,3 μm
1984
·
B. Orsal
, R. Alabedra
, et al.
·
Revue de Physique Appliquée
·
6
Détermination du facteur de multiplication M pour un fonctionnement optimal des photodétecteurs à avalanche
1980
·
Robert Alabedra
, Claude Maille
, et al.
·
Annals of Telecommunications
·
6
Reverse current and external quantum efficiency of zinc diffused 1.3-μm GaAlAsSb photodiodes
1990
·
M. Mebarki
, T. Belatoui
, et al.
·
Journal of Applied Physics
·
5
1/f noise and thermal noise of a GaAs/Al0.4Ga0.6As superlattice
1993
·
L. K. J. Vandamme
, S. Kibeya
, et al.
·
AIP conference proceedings
·
4
Utilisation des mesures de bruit pour la détermination du photocourant primaire dans les photodiodes à avalanche N+Pπ P+ au silicium
1980
·
R. Alabedra
, C. Maille
, et al.
·
Revue de Physique Appliquée
·
4
Noise studies in internal field emission diodes
1972
·
G. Lecoy
, R. Alabedra
, et al.
·
Solid-State Electronics
·
4
Valence band structure of Cd0.7Hg0.3Te determined by angular resolved photoemission
1990
·
G. Leveque
, B. Orsal
, et al.
·
Journal of Crystal Growth
·
3
Les photodiodes à avalanche Hg0,4Cd0,6Te à λ = 1,55 μm. Bruit près de la résonance due au couplage spin-orbite
1987
·
B. Orsal
, R. Alabedra
, et al.
·
Revue de Physique Appliquée
·
3
Frequency noise in 850-nm oxidized VCSELs
2003
·
Jean-Philippe Tourrenc
, Philippe Signoret
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Correlation between tuning section electrical noise and optical amplitude fluctuations in DBR two- and three-section tunable lasers emitting around 1.55 μm
2003
·
Mikhael Myara
, Philippe Signoret
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
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Works count:
81
Citation count:
360
H-index:
10
I10-index:
10
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