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Moon Sung Chung

Observed names: M S Chung, M. S. CHUNG, M. S. Chung, M.S Chung, M.S. Chung, Moon Chung, Moon S Chung, Moon S. Chung, MoonS. Chung
OpenAlex ID: A5108404201
Simple calculation of energy distribution of low-energy secondary electrons emitted from metals under electron bombardment
1974 · M. S. Chung, T. E. Everhart · Journal of Applied Physics · 272
Role of plasmon decay in secondary electron emission in the nearly-free-electron metals. Application to aluminum
1977 · M. S. Chung, T. E. Everhart · Physical review. B, Solid state · 138
Derivation of the image interaction for non-planar pointed emitter geometries: application to field emission I–V characteristics
1991 · Jun He, P.H. Cutler, et al. · Surface Science · 71
Spherical tip model in the theory of the scanning tunneling microscope
1987 · Moon S. Chung, T. Emanuel Feuchtwang, et al. · Surface Science · 51
The use of internal field emission to inject electronic charge carriers into the conduction band of diamond films: a review
1999 · P.H Cutler, N.M Miskovsky, et al. · Applied Surface Science · 43
Theoretical analysis of the enhanced electric field at the triple junction
2004 · Moon S. Chung, Byung-G. Yoon, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 39
Energy exchange processes in electron emission at high fields and temperatures
1994 · M. S. Chung, P. H. Cutler, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 39
Band structure calculation of field emission from AlxGa1−xN as a function of stoichiometry
2000 · M. S. Chung, N. M. Miskovsky, et al. · Applied Physics Letters · 34
Idealized spatial emission distribution of secondary electrons
1972 · T. E. Everhart, M. S. Chung · Journal of Applied Physics · 26
Radiation from silver films bombarded by low-energy electrons
1980 · M.S. Chung, T.A. Callcott, et al. · Surface Science · 22
New analysis of electron energy exchange and cooling in semiconductors
2008 · M. S. Chung, S. C. Hong, et al. · Applied Physics Letters · 20
A new model for the replacement process in electron emission at high fields and temperatures
1994 · P.H. Cutler, M.S. Chung, et al. · Applied Surface Science · 20
Three-dimensional analysis of the rectifying properties of geometrically asymmetric metal-vacuum-metal junctions treated as an oscillating barrier
2008 · A. Mayer, M. S. Chung, et al. · Physical Review B · 19
Three-dimensional analysis of the geometrical rectifying properties of asymmetric metal-vacuum-metal junctions and extension for energy conversion
2008 · A. Mayer, M. S. Chung, et al. · Physical Review B · 18
Improved calculations of secondary electron energy distributions of metals
1975 · M. S. Chung · Journal of Applied Physics · 18
Theoretical analysis of triple junction field emission for a type of cold cathode
2006 · M. S. Chung, S. C. Hong, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 17
Theoretical analysis of the field enhancement in a two-dimensional triple junction
2005 · Moon S. Chung, Tae S. Choi, et al. · Applied Surface Science · 16
Simulations of infrared and optical rectification by geometrically asymmetric metal–vacuum–metal junctions for applications in energy conversion devices
2010 · A Mayer, M S Chung, et al. · Nanotechnology · 15
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Theoretical analysis of a field emission enhanced semiconductor thermoelectric cooler
2003 · Moon Chung, N.M. Miskovsky, et al. · Solid-State Electronics · 15
Classical and quantum responsivities of geometrically asymmetric metal-vacuum-metal junctions used for the rectification of infrared and optical radiations
2011 · A. Mayer, M. S. Chung, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 13
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Analysis of the slope of the Fowler–Nordheim plot for field emission from n-type semiconductors
2003 · M. S. Chung, B.-G. Yoon · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 13
Field emission cooling of thermoelectric semiconductor PbTe
2011 · M. S. Chung, A. Mayer, et al. · Applied Physics Letters · 12
Particulates and Trace Pollutant Removal by Depth Filtration
1979 · Michael C. Kavanaugh, George Toregas, et al. · Elsevier eBooks · 11
Dielectric effect on electric fields in the vicinity of the metal–vacuum–dielectric junction
2012 · M.S. Chung, A. Mayer, et al. · Ultramicroscopy · 9
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Calculation of bulk states contributions to field emission from GaN
1998 · M. S. Chung, B.-G. Yoon, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 8
Works count: 111
Citation count: 1,090
H-index: 16
I10-index: 23
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