Author

Yong‐Jun Kim

Observed name: Y.-J. Kim

Institution: Samsung Electronics (South Korea)

Observed institutions: Samsung (South Korea), Samsung Electronics (South Korea), Samsung Display (South Korea)

OpenAlex ID: A5108470711

Scaling of Memory Performance and Capacity with CXL Memory Expander

2022 · S. J. Park, H. Kim, et al. · IEEE Hot Chips Symposium · 22

Holistic, model-based optimization of edge leveling as an enabler for lithographic focus control: application to a memory use case

2016 · T. Hasan, Y.-S. Kang, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4

Note: In situ parameter extraction from a nonlinear dynamic model for electrical characterization of organic light emitting diodes

2014 · M. C. Yoon, S. H. Choi, et al. · Review of Scientific Instruments · 1

Works count: 3

Citation count: 27

H-index: 2

I10-index: 1