Author

Ya‐Ning Xie

Observed names: Xie, Yunzhou, Y. N. Xie, Y.N Xie

Institution: Imperial College London

Observed institutions: Stockholm University, Chinese Academy of Sciences, Institute of High Energy Physics, Beijing Synchrotron Radiation Facility, Imperial College London

OpenAlex ID: A5108481234

An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode

2000 · T Liu, Y.N Xie, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 6

Photoconductivity measurement of polymers by x-ray absorption fine structure

1999 · T. D. Hu, Y. N. Xie, et al. · Journal of Applied Physics · 1

Numina-Lean-Agent: An Open and General Agentic Reasoning System for Formal Mathematics

2026 · Liu, Junqi, Zhou, Zihao, et al. · arXiv (Cornell University)

CombiBench: Benchmarking LLM Capability for Combinatorial Mathematics

2025 · Liu, Junqi, Lin, Xiaohan, et al. · arXiv (Cornell University)

Determination of Chemical Valence States in Dilute Samples Using a Combination of Fluorescence Ion Chamber and PIN Photon Diode

2005 · Y. N. Xie, J. Zhang, et al. · Physica Scripta

Works count: 5

Citation count: 7

H-index: 1

I10-index: