Author

Gong-Kai Lin

2016 · Cheng-Yen Wu, Hsin-Chiang You, et al. · Japanese Journal of Applied Physics · 5
2020 · Shao-Chang Huang, Ching-Ho Li, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) · 3
2023 · Jian-Hsing Lee, Gong-Kai Lin, et al. · IEEE International Reliability Physics Symposium proceedings · 2
2022 · Shao-Chang Huang, Jian-Hsing Lee, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) · 2
2020 · Shao-Chang Huang, Ching-Ho Li, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) · 2
2024 · Jian-Hsing Lee, Chih-Cherng Liao, et al. · IEEE Transactions on Electron Devices · 1
2021 · Shao-Chang Huang, Ching-Ho Li, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) · 1
2023 · Shao-Chang Huang, Kai-Chieh Hsu, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)
2023 · Shao-Chang Huang, Ching-Ho Li, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)
2023 · Shao-Chang Huang, Chien-Wei Wang, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)
2022 · Shao-Chang Huang, Jian-Hsing Lee, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)
2021 · Shao-Chang Huang, Yu-Yung Kao, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)
2021 · Shao-Chang Huang, Ching-Ho Li, et al. · Microelectronics Reliability
Works count: 15
Citation count: 25
H-index: 3
I10-index:
Year
Topic
Type