Author

S. T. Woo

Observed names: S.T. Woo, Swee-Tuck Woo
Observed institution: GlobalFoundries (Singapore)
ORCID: 0009-0009-8885-4337
Observed ORCID: 0009-0009-8885-4337
OpenAlex ID: A5108717361
2019 · V. B. Naik, K. Lee, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 76
2017 · D. Shum, D. Houssameddine, et al. · Symposium on VLSI Technology · 51
2020 · V. B. Naik, K. Yamane, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 47
2018 · K. Lee, R. Chao, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 46
2018 · K. Lee, K. Yamane, et al. · Symposium on VLSI Technology · 37
2020 · T. Y. Lee, K. Yamane, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 21
2006 · H.M. Lee, S.T. Woo, et al. · IEEE International Memory Workshop (IMW) · 16
2020 · T. Y. Lee, K. Yamane, et al. · IEEE International Reliability Physics Symposium proceedings · 15
2011 · Wein-Town Sun, Cheng-Jye Liu, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 9
2020 · T. Y. Lee, K. Yamane, et al. · Symposium on VLSI Technology · 5
2007 · H. M. Lee, L. Lim, et al. · International Conference on Solid State Devices and Materials (SSDM) · 2
Works count: 13
Citation count: 333
H-index: 9
I10-index: 8
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