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Hee-Cheol Joo
Institution:
Soongsil University
Observed institution:
Soongsil University
ORCID:
0009-0001-0624-5506
Observed ORCID:
0009-0001-0624-5506
OpenAlex ID:
A5108909804
Compact Characteristic Modeling of Cryo-CMOS Transistors Based on Commercial Process Design Kit
2024
·
Seung Chae Jung
, Hee-Cheol Joo
, et al.
·
International Conference on Electronics, Information, and Communication (ICEIC)
·
2
A 0.4-VIN, External-Capacitor-Free, Adaptive-Biased LDO with Look-Ahead Droop Reduction for Wake-up Features in Edge Devices
2023
·
Hee-Cheol Joo
, Hyein Kim
, et al.
·
International SoC Design Conference
·
1
An 11.5-Gb/s/pin, 0.4-V Driver-Supply Transmitter With Switched-Coupling Charge-Pump-Based Crosstalk Cancellation for Ultra-Dense Capacitively Coupled Channels
2026
·
Yoochang Kim
, Seunghoon Yi
, et al.
·
IEEE Journal of Solid-State Circuits
A 1.5-to-300-K Power-on-Reset Circuit With Code-Defined Room-Temperature and Cryogenic Operating Modes in 28-nm CMOS
2026
·
Hee-Cheol Joo
, Yoochang Kim
, et al.
·
IEEE Transactions on Circuits & Systems II Express Briefs
A Geometry-Scalable DC I – V Calibration Methodology for a Commercial Bulk CMOS Process Design Kit for Cryogenic ICs Operating Near 1 K
2026
·
Hee-Cheol Joo
, Seunghoon Yi
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A 3.2-GHz Ring-Oscillator-Based Charge-Pump PLL With Time-Domain Optimization of PFD Reset Delay
2026
·
Seunghoon Yi
, Hee-Cheol Joo
, et al.
·
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
An 11.5-Gb/s/Pin Transmitter With Edge-Controlled Crosstalk Cancellation for Maximum Suppression of Crosstalk-Induced Jitter
2026
·
Yoochang Kim
, Seung Chae Jung
, et al.
·
IEEE Transactions on Circuits and Systems I Regular Papers
A 12.8-Gb/s/lane, 1.03-pJ/b Transmitter With Reconfigurable Charge-Injecting Crosstalk Cancellation For Capacitively Coupled High-Density Interconnects
2024
·
Yoochang Kim
, Seunghoon Yi
, et al.
·
International SoC Design Conference
An All-Digital Standard-Cell-Based Resistive-Sensing Display Panel/Chip Crack Detector
2024
·
Hyunwook Lee
, Hee-Cheol Joo
, et al.
·
International SoC Design Conference
PSP Model-Based Emulation Method for Geometry-Dependent Cryogenic Effects in 28-nm Bulk CMOS Technology
2024
·
Seunghoon Yi
, Hee-Cheol Joo
, et al.
·
International Conference on Electronics, Information, and Communication (ICEIC)
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Works count:
10
Citation count:
3
H-index:
1
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