Author

X.J. Xie

2001 · M. Thoben, X. Xie, et al. · Microelectronics Reliability · 15
2015 · C. Lv, T.N. Qiu, et al. · Physics Procedia · 7
2021 · X. J. Xie, R. J. Si, et al. · Journal of Materials Science · 6
2017 · B. C. Deng, X. J. Xie, et al. · IOP Conference Series Materials Science and Engineering · 6
2019 · X J Xie, S Q Yang, et al. · IOP Conference Series Materials Science and Engineering · 5
2024 · W Wu, S Q Yang, et al. · IOP Conference Series Materials Science and Engineering · 2
2025 · W Wu, S Q Yang, et al. · IOP Conference Series Materials Science and Engineering · 1
2025 · H. Y. Ren, S. Q. Yang, et al. · IOP Conference Series Materials Science and Engineering · 1
2025 · Wei, Mingjie, Xie, Xuemei, et al. · arXiv (Cornell University) · 1
2019 · B C Deng, S Q Yang, et al. · IOP Conference Series Materials Science and Engineering · 1
2026 · Xin Liao, Yaodan Liang, et al. · IEEE International Symposium on the Application of Artificial Intelligence in Electrical Engineering (AAIEE)
2025 · Q M Jia, X J Xie, et al. · IOP Conference Series Materials Science and Engineering
2025 · W Pan, S Q Yang, et al. · IOP Conference Series Materials Science and Engineering
2019 · W Pan, J H Wu, et al. · IOP Conference Series Materials Science and Engineering
2006 · X.J. Xie, A. Raja Annamalai, et al. · Bulletin of the American Physical Society
2004 · X. Chen, Qizhen Li, et al. · ENLIGHTEN (Jurnal Bimbingan dan Konseling Islam)
Works count: 24
Citation count: 150
H-index: 6
I10-index: 4
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